Surface electronic and structural properties of nanostructured titanium oxide grown by pulsed laser deposition

Surface Science

Volumn 605, Issue 3-4, 2011, Pages 333-340

  Fusi, M ^a   MacCallini, E ^b   Caruso, T ^b   Casari, C S ^a,f   Li Bassi, A ^a,f   Bottani, C E ^a,f   Rudolf, P ^c   Prince, K C ^d,e   Agostino, R G ^b  

^a POLITECNICO DI MILANO   (Italy)

^b UNIVERSITY OF CALABRIA   (Italy)

^c UNIVERSITY OF GRONINGEN   (Netherlands)

^d SINCROTRONE TRIESTE   (Italy)

^e IOM CNR LABORATORIO TASC   (Italy)

^f ISTITUTO ITALIANO DI TECNOLOGIA   (Italy)

Author keywords

Electron spectroscopy UPS; NEXAFS; Pulsed laser deposition PLD; Surface structure and defects; Synchrotron radiation; Titanium dioxide; X ray absorption spectroscopy XAS; XPS

Indexed keywords

ANATASE PHASE; ANNEALED FILMS; AS-DEPOSITED FILMS; DEFECT FORMATION; DEFECT STATE; DISORDERED STRUCTURES; ELECTRONIC AND STRUCTURAL PROPERTIES; FINE STRUCTURES; GROWTH PARAMETERS; MULTI-TECHNIQUE APPROACH; NANOSTRUCTURED THIN FILM; NANOSTRUCTURED TITANIUM; NEXAFS; OPEN STRUCTURE; PHOTON BEAMS; PULSED LASER; SAMPLE STRUCTURE; STRUCTURAL AND MORPHOLOGICAL PROPERTIES; STRUCTURAL MODIFICATIONS; STRUCTURAL ORDERS; SURFACE HYDROXYL; SURFACE REACTIVITY; SURFACE STABILITY; TERMINAL GROUPS; ULTRAVIOLET PHOTOEMISSION SPECTROSCOPY; X-RAY ABSORPTION SPECTRUM; XPS;

ABSORPTION; BINDING ENERGY; DEFECT STRUCTURES; DEPOSITION; ELECTRON SPECTROSCOPY; EMISSION SPECTROSCOPY; MORPHOLOGY; OXIDE FILMS; OXIDE MINERALS; PULSED LASER DEPOSITION; PULSED LASERS; RAMAN SPECTROSCOPY; SURFACE DEFECTS; SURFACE STRUCTURE; SYNCHROTRON RADIATION; SYNCHROTRONS; TITANIUM; TITANIUM DIOXIDE; TITANIUM OXIDES; X RAY ABSORPTION; X RAY ABSORPTION SPECTROSCOPY; X RAY PHOTOELECTRON SPECTROSCOPY; X RAYS;

ABSORPTION SPECTROSCOPY;

EID: 78651245656     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2010.10.039     Document Type: Article

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