Photoemission investigations on nanostructured TiO2 grown by cluster assembling

Surface Science

Volumn 601, Issue 13, 2007, Pages 2688-2691

  Caruso, T ^a   Lenardi, C ^b,c   Mazza, T ^c   Policicchio, A ^a   Bongiorno, G ^c   Agostino, R G ^a   Chiarello, G ^a   Colavita, E ^a   Finetti, P ^d   Prince, K C ^e   Ducati, C ^f   Piseri, P ^c   Milani, P ^c  

^a UNIVERSITY OF CALABRIA   (Italy)

^b Istituto di Fisiologia Generale e Chimica Biologica   (Italy)

^c UNIVERSITY OF MILAN   (Italy)

^d UNIVERSITY OF PADOVA   (Italy)

^e SINCROTRONE TRIESTE   (Italy)

^f UNIVERSITY OF CAMBRIDGE   (United Kingdom)

Author keywords

Defects; Nanostructures; Photoelectron spectroscopy; Titanium oxide; Transmission electron microscopy

Indexed keywords

CLUSTER ANALYSIS; DEFECTS; ENERGY GAP; NANOSTRUCTURED MATERIALS; PHOTOELECTRON SPECTROSCOPY; PHOTOEMISSION; TRANSMISSION ELECTRON MICROSCOPY;

CLUSTER ASSEMBLING; SUPERSONIC CLUSTER BEAM DEPOSITION METHOD; VOLUME RATIO;

TITANIUM DIOXIDE;

EID: 34250877387     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2006.12.025     Document Type: Article

References (17)

1. Garzella C., Comini E., Tempesti E., Frigeri C., and Sberveglieri G. Sens. Actuat. B 68 (2000) 189
2. Fujishima A., Rao T.N., and Tryk D.A. J. Photochem. Photobiol. C 1 (2000) 1
3. Gratzel M. In: Kamat P.V., and Meisel D. (Eds). Semiconductor Nanoclusters - Physical Chemical and Catalytic Aspects (1997), Elsevier, Amsterdam 353
4. In: Brunette D., Tengvall P., Textor M., and Thomsen P. (Eds). Titanium in Medicine: Material Science, Surface Science, Engineering, Biological Response and Medical Applications (2001), Springer Verlag, Heidelberg and Berlin
5. Jang H.D., Kim S.-K., and Kim S.-J. J. Nanoparticle Res. 3 (2001) 141
6. Justicia I., Ordej'on P., Canto G., Mozos J.L., Fraxedas J., Battiston G.A., Gerbasi R., and Figueras A. Adv. Mater. 14 (2002) 1399
7. Barborini E., Kholmanov I.N., Piseri P., Ducati C., Bottani C.E., and Milani P. Appl. Phys. Lett. 81 (2002) 3052
8. Milani P., Piseri P., Barborini E., Podestà A., and Lenardi C. J. Vac. Sci. Tech. A 19 (2001) 2025
9. Diebold U. Surf. Sci. Rep. 48 (2003) 53
10. Sanjinés R., Tang H., Berger H., Gozzo F., Margaritondo G., and Lévy F. J. Appl. Phys. 75 (1994) 2945
11. Caruso T., Agostino R.G., Bongiorno G., Barborini E., Piseri P., Milani P., Lenardi C., La Rosa S., and Bertolo M. Appl. Phys. Lett. 84 (2004) 3412
12. Wang L.-Q., Ferris K.F., Skiba P.X., Shultz A.N., Baer D.R., and Engelhard M.H. Surf. Sci. 440 (1999) 60
13. Vasina R., Kolarik V., Dolezel P., Mynar M., Vondracek M., Chab V., Slezak J., Comicioli C., and Prince K.C. Nucl. Instr. and Meth. Phys. Res. A 467-468 (2001) 561
14. Noda H., Oikawa K., Ogata T., Matsuki K., and Kamada H. Nippon Kagaku Kaishi 8 (1986) 1084
15. Bond G.C., and Flamerz S. Appl. Catal. 46 (1989) 89
16. Munnix S., and Schmeits M. Phys. Rev. B 30 (1984) 2202
17. See for example http://www.nist.gov.srd/nist71.htm, the NIST Standard Reference Database 71: NIST Electron Inelastic-Mean-Free-Path Database.