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Volumn 9, Issue 5, 2010, Pages 423-429

Optical and electrical characterization of ZnO thin film

Author keywords

FESEM; optical band gap; TEM; thermally activated process; UVVis spectra; XRD; ZnO nanoparticles

Indexed keywords

FESEM; TEM; THERMALLY ACTIVATED PROCESS; UV-VIS SPECTRA; XRD; ZNO NANOPARTICLES;

EID: 78651109540     PISSN: 0219581X     EISSN: None     Source Type: Journal    
DOI: 10.1142/S0219581X10007083     Document Type: Article
Times cited : (3)

References (31)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.