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Volumn 9, Issue 5, 2010, Pages 423-429
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Optical and electrical characterization of ZnO thin film
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Author keywords
FESEM; optical band gap; TEM; thermally activated process; UVVis spectra; XRD; ZnO nanoparticles
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Indexed keywords
FESEM;
TEM;
THERMALLY ACTIVATED PROCESS;
UV-VIS SPECTRA;
XRD;
ZNO NANOPARTICLES;
ARGON;
DC POWER TRANSMISSION;
DEPOSITION;
ELECTRIC PROPERTIES;
ENERGY GAP;
GLASS;
LIQUID NITROGEN;
METALLIC FILMS;
NANOPARTICLES;
OPTICAL BAND GAPS;
OPTICAL FILMS;
OPTICAL PROPERTIES;
OXYGEN;
PHOTONS;
PHYSICAL VAPOR DEPOSITION;
SUBSTRATES;
THIN FILMS;
TRANSMISSION ELECTRON MICROSCOPY;
ZINC;
ZINC SULFIDE;
ZINC OXIDE;
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EID: 78651109540
PISSN: 0219581X
EISSN: None
Source Type: Journal
DOI: 10.1142/S0219581X10007083 Document Type: Article |
Times cited : (3)
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References (31)
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