Singular beam scanning microscopy: Preliminary experimental results

Optical Engineering

Volumn 49, Issue 4, 2010, Pages

  Spektor, Boris ^a   Normatov, Alexander ^a   Shamir, Joseph ^a  

^a TECHNION ISRAEL INSTITUTE OF TECHNOLOGY   (Israel)

Author keywords

diffraction; focus; igh numerical aperture; nanoscale; ocusing; scanning microscopy; singular beam

Indexed keywords

IGH NUMERICAL APERTURE; NANO SCALE; OCUSING; SCANNING MICROSCOPY; SINGULAR BEAMS;

DIFFRACTION; ENGINEERING; FOCUSING; MOLECULAR PHYSICS;

NANOTECHNOLOGY;

EID: 78650961124     PISSN: 00913286     EISSN: 15602303     Source Type: Journal    
DOI: 10.1117/1.3381180     Document Type: Article

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