Singular beam microscopy

Applied Optics

Volumn 47, Issue 4, 2008, Pages

  Spektor, Boris ^a   Normatov, Alexander ^a   Shamir, Joseph ^a  

^a TECHNION ISRAEL INSTITUTE OF TECHNOLOGY   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; OPTICAL MICROSCOPY; PARAMETER ESTIMATION; POLARIZATION; SCANNING; SIGNAL TO NOISE RATIO;

OPTICAL FIELD; SCANNING PROCESS; SINGULAR BEAM MICROSCOPY;

OBJECT RECOGNITION;

ALGORITHM; ARTICLE; BIOLOGICAL MODEL; COMPUTER ASSISTED DIAGNOSIS; EVALUATION; IMAGE ENHANCEMENT; METHODOLOGY; MICROSCOPY; REPRODUCIBILITY; SENSITIVITY AND SPECIFICITY;

ALGORITHMS; IMAGE ENHANCEMENT; IMAGE INTERPRETATION, COMPUTER-ASSISTED; MICROSCOPY; MODELS, BIOLOGICAL; REPRODUCIBILITY OF RESULTS; SENSITIVITY AND SPECIFICITY;

EID: 41449101015     PISSN: 1559128X     EISSN: 15394522     Source Type: Journal    
DOI: 10.1364/AO.47.000A78     Document Type: Article

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