Nanoshaped objects of equal phase volume: Scattered far field comparison

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 7390, Issue , 2009, Pages

  Normatov, Alexander ^a   Spektor, Boris ^a  

^a TECHNION ISRAEL INSTITUTE OF TECHNOLOGY   (Israel)

Author keywords

Measurement sensitivity; Nano object shape; Nanoscale object

Indexed keywords

FAR FIELD; FOCUSED BEAMS; FORWARD SCATTERING; MEASUREMENT SENSITIVITY; NANO SCALE; NANO-OBJECT SHAPE; NANO-SCALE OBJECTS; NANOSCALE OBJECT; OPTICAL ELEMENTS; PARAXIAL; PHASE OBJECT; PHASE VOLUME; RESPONSE SENSITIVITY; SCANNING MODE;

NANOSTRUCTURED MATERIALS;

OPTICAL CORRELATION;

EID: 69949162112     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.827514     Document Type: Conference Paper

References (8)

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