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Volumn , Issue , 2010, Pages 487-492

Application-aware diagnosis of runtime hardware faults

Author keywords

[No Author keywords available]

Indexed keywords

APPLICATION PROGRAMS; COMPUTER AIDED DESIGN; COMPUTER HARDWARE; SOFTWARE TESTING;

EID: 78650906740     PISSN: 10923152     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICCAD.2010.5653788     Document Type: Conference Paper
Times cited : (11)

References (18)
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  • 2
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    • Microprocessors in the era of terascale integration
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  • 3
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    • A scalable software-based self-test methodology for programmable processors
    • Jun
    • L. Chen, S. Ravi, A. Raghunathan, and S. Dey. "A Scalable Software-Based Self-Test Methodology for Programmable Processors." In Proc.', of DAC, Jun 2003.
    • (2003) Proc.', of DAC
    • Chen, L.1    Ravi, S.2    Raghunathan, A.3    Dey, S.4
  • 7
    • 77950976118 scopus 로고    scopus 로고
    • Adaptive online testing for efficient hard fault detection
    • Oct
    • S. Gupta, A. Ansari, S. Feng, and S. Mahlke. "Adaptive online testing for efficient hard fault detection." In Proc. of ICCD, Oct 2009.
    • (2009) Proc. of ICCD
    • Gupta, S.1    Ansari, A.2    Feng, S.3    Mahlke, S.4
  • 8
    • 53349140999 scopus 로고    scopus 로고
    • Understanding the propagation of hard errors to software and implications for resilient system design
    • Mar
    • M.-L. Li, P. Ramachandran, S. Sahoo, S. Adve, V. Adve, and Y. Zhou. "Understanding the propagation of hard errors to software and implications for resilient system design." In Proc. of ASPLOS, Mar 2008.
    • (2008) Proc. of ASPLOS
    • Li, M.-L.1    Ramachandran, P.2    Sahoo, S.3    Adve, S.4    Adve, V.5    Zhou, Y.6
  • 9
    • 49749112001 scopus 로고    scopus 로고
    • CASP: Concurrent autonomous chip self-test using stored test patterns
    • Mar
    • Y. Li, M. Samy, and S. Mitra. "CASP: Concurrent autonomous chip self-test using stored test patterns." In Proc. of DATE, Mar 2008.
    • (2008) Proc. of DATE
    • Li, Y.1    Samy, M.2    Mitra, S.3
  • 12
    • 84941181463 scopus 로고
    • Operational profiles in software-reliability engineering
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    • J. Musa. "Operational profiles in software-reliability engineering." IEEE Software, Mar 1993.
    • (1993) IEEE Software
    • Musa, J.1
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    • 78650880512 scopus 로고    scopus 로고
    • Standard Performance Evaluation Corp. 2005
    • Standard Performance Evaluation Corp. "SPECweb2005." http://www.spec.org/, 2005.
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    • Textuality Services, Inc. 1996
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.