Efficiency enhancement of copper contaminated radial p-n junction solar cells

Chemical Physics Letters

Volumn 501, Issue 4-6, 2011, Pages 153-158

  Boukai, Akram ^a,d   Haney, Paul ^b   Katzenmeyer, Aaron ^c   Gallatin, Gregg M ^b   Talin, A Alec ^b   Yang, Peidong ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^c SANDIA NATIONAL LABORATORIES   (United States)

^d UNIVERSITY OF MICHIGAN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION LENGTH; CARRIER DIFFUSION LENGTH; COPPER IMPURITIES; DIFFUSION LENGTH; EFFICIENCY ENHANCEMENT; MICRON SCALE; MINORITY CARRIER; NANO SCALE; P-N JUNCTION;

CONTAMINATION; COPPER; DIFFUSION; FLIGHT DYNAMICS; SEMICONDUCTING SILICON COMPOUNDS; SILICON WAFERS; SOLAR CELLS;

SEMICONDUCTOR JUNCTIONS;

EID: 78650811750     PISSN: 00092614     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.cplett.2010.11.069     Document Type: Article

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