Electrostatic and electrochemical nature of liquid-gated electric-double-layer transistors based on oxide semiconductors

Journal of the American Chemical Society

Volumn 132, Issue 51, 2010, Pages 18402-18407

  Yuan, Hongtao ^a,b   Shimotani, Hidekazu ^a,b   Ye, Jianting ^a   Yoon, Sungjae ^c   Aliah, Hasniah ^c   Tsukazaki, Atsushi ^a   Kawasaki, Masashi ^d   Iwasa, Yoshihiro ^a,b  

^a UNIVERSITY OF TOKYO   (Japan)

^b JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

^c TOHOKU UNIVERSITY   (Japan)

^d TOHOKU UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE VOLTAGE; CARRIER ACCUMULATION; CHARGING MECHANISM; DIRECT MEASURES; DOUBLE LAYERS; ELECTRICAL TRANSPORT MEASUREMENTS; ELECTROCHEMICAL CHARGING; FREQUENCY MAPPING; HIGH-DENSITY; INTERFACIAL CAPACITANCE; INTRINSIC NATURE; LIQUID/SOLID INTERFACE; MOBILE CARRIERS; OXIDE SEMICONDUCTOR; PSEUDOCAPACITANCE; SIMPLE METHOD; ZNO;

CAPACITANCE; ELECTROCHEMICAL CORROSION; ELECTROSTATICS; HALL EFFECT; IONIC LIQUIDS; MAGNETIC FIELD EFFECTS; PHASE DIAGRAMS; PHASE INTERFACES; ZINC OXIDE;

ELECTROCHEMICAL IMPEDANCE SPECTROSCOPY;

ZINC OXIDE;

ARTICLE; ELECTRIC CAPACITANCE; ELECTRIC DOUBLE LAYER TRANSISTOR; ELECTRIC FIELD; ELECTRIC POTENTIAL; ELECTROCHEMISTRY; FREQUENCY ANALYSIS; SEMICONDUCTOR; STATIC ELECTRICITY;

EID: 78650616298     PISSN: 00027863     EISSN: 15205126     Source Type: Journal    
DOI: 10.1021/ja108912x     Document Type: Article

References (31)

1. Ahn, C. H., Bhattacharya, A., Ventra, M. D., Eckstein, J. N., Frisbie, C. D., Gershenson, M. E., Goldman, A. M., Inoue, I. H., Mannhart, J., Millis, A. J., Morpurgo, A. F., Natelson, D., and Triscone, J. M. Rev. Mod. Phys. 2006, 78, 1185-1212
2. Cho, J. H., Lee, J., Xia, Y., Kim, B. S., He, Y., Renn, M. J., Lodge, T. P., and Frisbie, C. D. Nat. Mater. 2008, 7, 900-906
3. Ueno, K., Nakamura, S., Shimotani, H., Ohtomo, A., Kimura, N., Nojima, T., Aoki, H., Iwasa, Y., and Kawasaki, M. Nat. Mater. 2008, 7, 855-858
4. Ye, J. T., Inoue, S., Kobayashi, K., Kasahara, Y., Yuan, H. T., Shimotani, H., and Iwasa, Y. Nat. Mater. 2010, 9, 125-128
5. Shimotani, H., Diguet, G., and Iwasa, Y. Appl. Phys. Lett. 2005, 86 022104-1-3
6. Misra, R., McCarthy, M., and Hebard, A. F. Appl. Phys. Lett. 2007, 90 052905-1-3
7. Cho, J. H., Lee, J., He, Y., Kim, B. S., Lodge, T. P., and Frisbie, C. D. Adv. Mater. 2008, 20, 686-690
8. Herlogsson, L., Noh, Y. Y., Zhao, N., Crispin, X., Sirringhaus, H., and Berggren, M. Adv. Mater. 2008, 20, 4708-4713
9. Ono, S., Seki, S., Hirahara, R., Tominari, Y., and Takeya, J. Appl. Phys. Lett. 2008, 92, 103313
10. Dhoot, A. S., Israel, C., Moya, X., Mathur, N. D., and Friend, R. H. Phys. Rev. Lett. 2009, 102, 136402
11. Shimotani, H., Asanuma, H., Tsukazaki, A., Ohtomo, A., Kawasaki, M., and Iwasa, Y. Appl. Phys. Lett. 2007, 91 082106-1-3
12. Yuan, H. T., Shimotani, H., Tsukazaki, A., Ohtomo, A., Kawasaki, M., and Iwasa, Y. Adv. Funct. Mater. 2009, 19, 1046-1053
13. Xia, Y., Cho, J. H., Lee, J., Ruden, P. P., and Frisbie, C. D. Adv. Mater. 2009, 21, 2174-2179
14. Arico, A. S., Bruce, P. G., Scrosati, B., Tarascon, J. M., and Schalkwijk, W. V. Nat. Mater. 2005, 4, 366-377
15. Simon, P. and Gogotsi, Y. Nat. Mater. 2008, 7, 845-854
16. Miller, J. R. and Simon, P. Science 2008, 321, 651-652
17. Macdonald, J. R. and Barlow, C. A. J. Chem. Phys. 1962, 36, 3062-3080
18. Hunger, J., Stoppa, A., Schroedle, S., Hefter, G., and Buchner, R. Chem. Phys. Chem. 2009, 10, 723-733
19. Schäfer, H., Sternin, E., Stannarius, R., Arndt, M., and Kremer, F. Phys. Rev. Lett. 1996, 76, 2177-2180
20. Joly, L., Ybert, C., Trizac, E., and Bocquet, L. Phys. Rev. Lett. 2004, 93, 257805-1-3
21. Lauw, Y., Horne, M. D., Rodopoulos, T., and Leermakers, F. A. M. Phys. Rev. Lett. 2009, 103, 117801-1-4
22. Schwartz, G. A., Bergman, R., and Swenson, J. J. Chem. Phys. 2004, 120, 5736-5744
23. Sluyters-Rehbach, M. Pure Appl. Chem. 1994, 66, 1831-1891
24. Macdonald, J. R. In Electrically Based Microstructural Characterization, Symposium Proceedings; MRS: Pittsburgh, 1996; Vol. 411, pp 71 - 83.
25. Barsoukov, E. and Macdonald, J. R. Impedance Spectroscopy: Theory, Experiment and Applications, 2nd ed.; Wiley-Interscience, 2005.
26. Yuan, H. T., Shimotani, H., Tsukazaki, A., Ohtomo, A., Kawasaki, M., and Iwasa, Y. J. Am. Chem. Soc. 2010, 132, 6672-6678
27. Yoo, H. D., Jang, J. H., Ka, B. H., Rhee, C. K., and Oh, S. M. Langmuir 2009, 25, 11947-11954
28. Lo, S. H., Buchanan, D. A., Taur, Y., and Wang, W. IEEE Electron Device Lett. 1997, 18, 209-211
29. Card, H. C. and Rhoderick, E. H. J. Phys, D: Appl. Phys. 1971, 4, 1589-1601
30. Schuller, J., Mel'nichenko, Y. B., Richert, R., and Fischer, E. W. Phys. Rev. Lett. 1994, 73, 2224-1-4
31. Zhao, K. S. and He, K. J. Phys. Rev. B 2006, 74, 205319-1-10