Hydrogenation-induced surface polarity recognition and proton memory behavior at protic-ionic-liquid/oxide electric-double-layer interfaces

Journal of the American Chemical Society

Volumn 132, Issue 19, 2010, Pages 6672-6678

  Yuan, Hongtao ^a,b   Shimotani, Hidekazu ^a,b   Tsukazaki, Atsushi ^a   Ohtomo, Akira ^a   Kawasaki, Masashi ^a,b,c   Iwasa, Yoshihiro ^a,b  

^a TOHOKU UNIVERSITY   (Japan)

^b JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

^c TOHOKU UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ACTIVE IONS; ADSORPTION MECHANISM; CHANNEL SURFACE; DOUBLE LAYERS; ELECTRON TRANSPORT; HETEROGENEOUS INTERFACES; HIGH-DENSITY; INTERFACIAL INTERACTION; LARGE HYSTERESIS; LIQUID/SOLID INTERFACE; MEMORY DEVICE; NEW OPPORTUNITIES; NON-VOLATILE; SURFACE ATOMS; SURFACE POLARITIES; TRANSFER CHARACTERISTICS; ZNO;

ADSORPTION; DEHYDROGENATION; ELECTRIC FIELDS; GATE DIELECTRICS; GATES (TRANSISTOR); HYDROGENATION; IONIC LIQUIDS; PROTONS; ZINC OXIDE;

IONIZATION OF LIQUIDS;

IONIC LIQUID; METAL OXIDE; N,N DIETHYL N (2 METHOXYETHYL) N METHYLAMMONIUM BIS TRIFLUOROMETHYLSULFONYL)IMIDE; PROTIC IONIC LIQUID; PROTON; UNCLASSIFIED DRUG; ZINC OXIDE;

ADSORPTION; ARTICLE; DEVICE; ELECTRIC CAPACITANCE; ELECTRIC DOUBLE LAYER TRANSISTOR; ELECTROCHEMICAL IMPEDANCE SPECTROSCOPY; ELECTROCHEMISTRY; ELECTRODE; ELECTRONICS; HYDROGENATION; HYDROXYLATION; IMPEDANCE; LIQUID; MOLECULAR INTERACTION; SEMICONDUCTOR; SOLID;

EID: 77952368537     PISSN: 00027863     EISSN: 15205126     Source Type: Journal    
DOI: 10.1021/ja909110s     Document Type: Article

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