Localization of aluminium in tea (Camellia sinensis) leaves using low energy X-ray fluorescence spectro-microscopy

Journal of Plant Research

Volumn 124, Issue 1, 2011, Pages 165-172

  Tolrà, Roser ^a   Vogel Mikuš, Katarina ^b   Hajiboland, Roghieh ^a,c   Kump, Peter ^d   Pongrac, Paula ^b,d   Kaulich, Burkhard ^e   Gianoncelli, Alessandra ^e   Babin, Vladimir ^e   Barceló, Juan ^a   Regvar, Marjana ^b   Poschenrieder, Charlotte ^a  

^a UNIVERSITAT AUTÒNOMA DE BARCELONA   (Spain)

^b UNIVERSITY OF LJUBLJANA   (Slovenia)

^c UNIVERSITY OF TABRIZ   (Iran)

^d JO EF STEFAN INSTITUTE   (Slovenia)

^e SINCROTRONE TRIESTE   (Italy)

Author keywords

Camellia sinensis (L.) O. Kuntze; Cell wall; Elemental spatial distribution; Epidermis; LEXRF; Synchrotron based X ray fluorescence; Tea plant

Indexed keywords

CAMELLIA SINENSIS;

EID: 78650458030     PISSN: 09189440     EISSN: None     Source Type: Journal    
DOI: 10.1007/s10265-010-0344-3     Document Type: Article

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