Imaging ellipsometry of graphene

Applied Physics Letters

Volumn 97, Issue 23, 2010, Pages

  Wurstbauer, Ulrich ^a,c   Röling, Christian ^b   Wurstbauer, Ursula ^a,c   Wegscheider, Werner ^a,d   Vaupel, Matthias ^b,e   Thiesen, Peter H ^b   Weiss, Dieter ^a  

^a UNIVERSITY OF REGENSBURG   (Germany)

^b ACCURION GMBH   (Germany)

^c Columbia University ^*  (United States)

^d ETH ZURICH   (Switzerland)

^e CARL ZEISS SMT AG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

FLAT SUBSTRATES; GAAS; HIGH-LATERAL RESOLUTION; IMAGING ELLIPSOMETRY; VARIABLE ANGLE SPECTROSCOPIC ELLIPSOMETRY; VISIBLE RANGE;

OPTICAL CONSTANTS; OPTICAL PROPERTIES; SILICON COMPOUNDS; SPECTROSCOPIC ELLIPSOMETRY;

GRAPHENE;

EID: 78650401347     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3524226     Document Type: Article

References (27)

1. A. H. Castro Neto, F. Guinea, N. M. R. Peres, K. S. Novoselov, and A. K. Geim, Rev. Mod. Phys. RMPHAT 0034-6861 81, 109 (2009). 10.1103/RevModPhys.81.109
2. K. S. Novoselov, A. K. Geim, S. V. Morozov, D. Jiang, M. I. Katsnelson, I. V. Grigorieva, S. V. Dubonos, and A. A. Firsov, Nature (London) NATUAS 0028-0836 438, 197 (2005). 10.1038/nature04233
3. Y. Zhang, Y. Tan, H. Stormer, and P. Kim, Nature (London) NATUAS 0028-0836 438, 201 (2005). 10.1038/nature04235
4. A. F. Young and P. Kim, Nat. Phys. ZZZZZZ 1745-2473 5, 222 (2009). 10.1038/nphys1198
5. S. Bae, H. Kim, Y. Lee, X. Xu, J. -S. Park, Y. Zheng, J. Balakrishnan, T. Lei, H. Ri Kim, Y. I. Song, Y. -J. Kim, K. S. Kim, B. Ozyilmaz, J. -H. Ahn, B. H. Hong, and S. Iijima, Nat. Nanotechnol. NNAABX 1748-3387 5, 574 (2010). 10.1038/nnano.2010.132
6. F. Bonaccorso, Z. Sun, T. Hasan, and A. C. Ferrari, Nat. Photonics NPAHBY 1749-4885 4, 611 (2010). 10.1038/nphoton.2010.186
7. Y. Lin, K. A. Jenkins, A. Valdes-Garcia, J. P. Small, D. B. Farmer, and P. Avouris, Nano Lett. NALEFD 1530-6984 9, 422 (2009). 10.1021/nl803316h
8. U. Stöberl, U. Wurstbauer, W. Wegscheider, D. Weiss, and J. Eroms, Appl. Phys. Lett. APPLAB 0003-6951 93, 051906 (2008). 10.1063/1.2968310
9. M. Friedemann, K. Pierz, R. Stosch, and F. J. Ahlers, Appl. Phys. Lett. APPLAB 0003-6951 95, 102103 (2009). 10.1063/1.3224910
10. C. Dean, A. F. Young, I. Meric, C. Lee, L. Wang, S. Sorgenfrei, K. Watanabe, T. Taniguchi, P. Kim, K. Shepard, and J. Hone, Nat. Nanotechnol. NNAABX 1748-3387 5, 722 (2010). 10.1038/nnano.2010.172
11. K. I. Bolotin, K. J. Sikes, Z. Jiang, M. Klima, G. Fudenberg, J. Hone, P. Kim, and H. L. Stormer, Solid State Commun. SSCOA4 0038-1098 146, 351 (2008). 10.1016/j.ssc.2008.02.024
12. X. Hong, A. Posadas, K. Zou, C. H. Ahn, and J. Zhu, Phys. Rev. Lett. PRLTAO 0031-9007 102, 136808 (2009). 10.1103/PhysRevLett.102.136808
13. V. Meera and G. S. Setlur, J. Appl. Phys. JAPIAU 0021-8979 107, 033525 (2010). 10.1063/1.3295913
14. V. G. Kravets, A. N. Grigorenko, R. R. Nair, P. Blake, S. Anissimova, K. S. Novoselov, and A. K. Geim, Phys. Rev. B PLRBAQ 0556-2805 81, 155413 (2010). 10.1103/PhysRevB.81.155413
15. X. Wang, Y. P. Chen, and D. D. Nolte, Opt. Express OPEXFF 1094-4087 16, 22105 (2008). 10.1364/OE.16.022105
16. I. Jung, M. Vaupel, M. Pelton, R. Piner, D. A. Dikin, S. Stankovich, J. An, and R. S. Ruoff, J. Phys. Chem. C JPCCCK 1932-7447 112, 8499 (2008). 10.1021/jp802173m
17. K. S. Novoselov, D. Jiang, F. Schedin, T. Booth, V. Khothevicha, S. Morozov, and A. Geim, Proc. Natl. Acad. Sci. U.S.A. PNASA6 0027-8424 102, 10451 (2005). 10.1073/pnas.0502848102
18. K. S. Novoselov, A. K. Geim, S. V. Morozov, D. Jiang, Y. Zhang, S. V. Dubonos, I. V. Grigorieva, and A. A. Firsov, Science SCIEAS 0036-8075 306, 666 (2004). 10.1126/science.1102896
19. Accurion GmbH, Stresemannstr. 30, 37079 Göttingen, Germany, http://www.nanofilm.de.
20. O. S. O. America, Handbook of Optics: Devices, Measurements, and Properties, 2nd ed. (McGraw-Hill Professional, New York, 1994), Vol. 2.
21. Handbook of Ellipsometry, edited by, H. G. Tompkins, and, E. A. Irene, (William Andrew/Noyes, Norwich, 2005). 10.1007/3-540-27488-X
22. D. S. L. Abergel, A. Russell, and V. I. Fal'ko, Appl. Phys. Lett. APPLAB 0003-6951 91, 063125 (2007). 10.1063/1.2768625
23. P. Blake, E. W. Hill, A. H. C. Neto, K. S. Novoselov, D. Jiang, R. Yang, T. J. Booth, and A. K. Geim, Appl. Phys. Lett. APPLAB 0003-6951 91, 063124 (2007). 10.1063/1.2768624
24. K. Xu, P. Cao, and J. R. Heath, Science SCIEAS 0036-8075 329, 1188 (2010). 10.1126/science.1192907
25. X. Wang, M. Zhao, and D. D. Nolte, Appl. Phys. Lett. APPLAB 0003-6951 95, 081102 (2009). 10.1063/1.3212735
26. H. G. Tompkins and W. A. Mcgahan, Spectroscopic Ellipsometry and Reflectometry: A User's Guide (Wiley-Interscience, New York, 1999).
27. J. Eroms and D. Weiss, New J. Phys. NJOPFM 1367-2630 11, 095021 (2009). 10.1088/1367-2630/11/9/095021