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Volumn 97, Issue 24, 2010, Pages

Charge accumulation dynamics in organic thin film transistors

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE ACCUMULATION; CHARGE TRAP; DEVICE PERFORMANCE; FIELD-EFFECT MOBILITIES; GATE BIAS; GATE BIAS DEPENDENCE; ORGANIC THIN FILM TRANSISTORS; STEADY STATE; TRANSIENT CURRENT; TRANSIENT STATE;

EID: 78650397064     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3526374     Document Type: Article
Times cited : (9)

References (13)
  • 1
    • 66249097422 scopus 로고    scopus 로고
    • ADVMEW 0935-9648,. 10.1002/adma.200803211
    • R. A. Street, Adv. Mater. (Weinheim, Ger.) ADVMEW 0935-9648 21, 2007 (2009). 10.1002/adma.200803211
    • (2009) Adv. Mater. (Weinheim, Ger.) , vol.21 , pp. 2007
    • Street, R.A.1
  • 2
    • 77953885466 scopus 로고    scopus 로고
    • CSRVBR 0306-0012,. 10.1039/b909902f
    • H. Klauk, Chem. Soc. Rev. CSRVBR 0306-0012 39, 2643 (2010). 10.1039/b909902f
    • (2010) Chem. Soc. Rev. , vol.39 , pp. 2643
    • Klauk, H.1
  • 10
  • 11
    • 39349084848 scopus 로고    scopus 로고
    • Bias stress instability in pentacene thin film transistors: Contact resistance change and channel threshold voltage shift
    • DOI 10.1063/1.2844857
    • S. D. Wang, T. Minari, T. Miyadera, Y. Aoyagi, and K. Tsukagoshi, Appl. Phys. Lett. APPLAB 0003-6951 92, 063305 (2008). 10.1063/1.2844857 (Pubitemid 351263870)
    • (2008) Applied Physics Letters , vol.92 , Issue.6 , pp. 063305
    • Wang, S.D.1    Minari, T.2    Miyadera, T.3    Aoyagi, Y.4    Tsukagoshi, K.5


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.