Tuning the surface potential of Ag surfaces by chemisorption of oppositely-oriented thiolated carborane dipoles

Journal of Colloid and Interface Science

Volumn 354, Issue 1, 2011, Pages 168-174

  Lübben, Jörn F ^a   Baše, Tomáš ^b   Rupper, Patrick ^a   Künniger, Tina ^a   Macháček, Jan ^b   Guimond, Sébastien ^a  

^a SWISS FEDERAL LABORATORIES FOR MATERIALS SCIENCE AND TECHNOLOGY   (Switzerland)

^b INSTITUTE OF INORGANIC CHEMISTRY   (Czech Republic)

Author keywords

Adsorption; Contact angle; Dipole orientation; Scanning Kelvin Probe Force Microscopy; Self assembled monolayers; Silver surface; Surface potential; Thiolated carboranes; X ray photoelectron spectroscopy

Indexed keywords

CARBORANES; DIPOLE ORIENTATION; MODIFIED SURFACES; SCANNING KELVIN PROBE FORCE MICROSCOPY; SH GROUPS; SILVER FILM; SILVER SURFACE; XPS;

ADSORPTION; ANGLE MEASUREMENT; CHEMISORPTION; CONTACT ANGLE; ELECTRONS; HYDROCARBONS; ISOMERS; ORGANIC POLYMERS; PHOTOELECTRICITY; PHOTONS; PROBES; SCANNING; SELF ASSEMBLED MONOLAYERS; SURFACE POTENTIAL; SURFACE PROPERTIES; SURFACE TOPOGRAPHY; X RAY PHOTOELECTRON SPECTROSCOPY; X RAYS;

SILVER;

CARBORANE DERIVATIVE; HYDROCARBON; HYDROGEN; SILVER; THIOL DERIVATIVE;

ADSORPTION KINETICS; ARTICLE; ATOM; CHEMICAL ANALYSIS; CHEMICAL MODIFICATION; CHEMICAL STRUCTURE; CONCENTRATION (PARAMETERS); CONTACT ANGLE; CRYSTALLIZATION; DIPOLE; FILM; HYDROPHOBICITY; ISOMER; MEASUREMENT; MOLECULE; MORPHOLOGY; PRIORITY JOURNAL; SCANNING ELECTRON MICROSCOPY; SCANNING KELVIN PROBE FORCE MICROSCOPY; STRUCTURE ANALYSIS; SURFACE PROPERTY; TOPOGRAPHY; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 78650206042     PISSN: 00219797     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jcis.2010.10.052     Document Type: Article

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