Electrical properties and reduced Debye temperature of polycrystalline thin gold films

Journal of Physics D: Applied Physics

Volumn 43, Issue 46, 2010, Pages

  Ma, Weigang ^a   Zhang, Xing ^a   Takahashi, Koji ^b  

^a Tsinghua University   (China)

^b KYUSHU UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

BOUNDARY REFLECTION; BULK VALUE; DEFECTS AND IMPURITIES; ELECTRICAL PROPERTY; ELECTRICAL RESISTIVITY; GRAIN BOUNDARY SCATTERING; MEASURED RESULTS; PHONON SOFTENING; POLYCRYSTALLINE; SILVER FILM; SURFACE SCATTERING; TEMPERATURE DEPENDENCE; TEMPERATURE DEPENDENT; TEMPERATURE RANGE; THIN GOLD FILM;

DEBYE TEMPERATURE; ELECTRIC CONDUCTIVITY; GOLD; GRAIN BOUNDARIES; GRAIN SIZE AND SHAPE; METALLIC FILMS; PLATINUM; SCATTERING; TEMPERATURE DISTRIBUTION;

SILVER;

EID: 78650160511     PISSN: 00223727     EISSN: 13616463     Source Type: Journal    
DOI: 10.1088/0022-3727/43/46/465301     Document Type: Article

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