Influence of grain boundary scattering on the electrical properties of platinum nanofilms

Applied Physics Letters

Volumn 89, Issue 11, 2006, Pages

  Zhang, Q G ^a   Zhang, X ^a   Cao, B Y ^a   Fujii, M ^b   Takahashi, K ^b   Ikuta, T ^b  

^a TSINGHUA UNIVERSITY   (China)

^b KYUSHU UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CONDUCTIVITY; ELECTRIC PROPERTIES; ELECTRON SCATTERING; GRAIN BOUNDARIES; NANOSTRUCTURED MATERIALS; PLATINUM; POLYCRYSTALLINE MATERIALS;

BULK METALS; POLYCRYSTALLINE METALLIC FILMS; POLYCRYSTALLINE PLATINUM NANOFILMS; TEMPERATURE COEFFICIENT;

THIN FILMS;

EID: 33748689558     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2338885     Document Type: Article

References (15)

1. J. J. Thomson, Proc. Cambridge Philos. Soc. 11, 120 (1901).
2. K. Fuchs, Proc. Cambridge Philos. Soc. 34, 100 (1938).
3. E. H. Sondheimer, Adv. Phys. 1, 1 (1952).
4. A. F. Mayadas, M. Shatzkes, and J. F. Janak, Appl. Phys. Lett. 14, 345 (1969).
5. A. F. Mayadas and M. Shatzkes, Phys. Rev. B 1, 1382 (1970).
6. J. R. Sambles, Thin Solid Films 106, 321 (1983).
7. G. Kästle, H. G. Boyen, A. Schröder, A. Plettl, and P. Ziemann, Phys. Rev. B 70, 165414 (2004).
8. W. Wu, S. H. Brongersma, M. Van Hove, and K. Maex, Appl. Phys. Lett. 84, 2838 (2004).
9. J. W. C. Devries, Thin Solid Films 167, 25 (1988).
10. X. Zhang, H. Q. Xie, M. Fujii, H. Ago, K. Takahashi, T. Ikuta, H. Abe, and T. Shimizu, Appl. Phys. Lett. 86, 171912 (2005).
11. X. Zhang, H. Q. Xie, M. Fujii, K. Takahashi, H. Ago, T. Shimizu, and H. Abe, Netsu Bussei 19, 9 (2005).
12. C. R. Tellier and A. J. Tosser, Thin Solid Films 44, 201 (1977).
13. C. R. Tellier and A. J. Tosser, Thin Solid Films 43, 261 (1977).
14. B. Roy and D. Chakravorty, J. Phys.: Condens. Matter 2, 9323 (1990).
15. M. Mukherjee, S. K. Saha, and D. Chakravorty, Appl. Phys. Lett. 63, 42 (1993).