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Volumn , Issue , 2010, Pages 44-49

Excellent rear side passivation on multi-crystalline silicon solar cells with 20 nm uncapped Al2O3 layer: Industrialization of ALD for solar cell applications

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM OXIDES; BIFACIAL CELL; CO-FIRING; CRYSTALLINE SILICON SOLAR CELLS; FORMING GAS; HIGH THROUGHPUT; LOW GROWTH RATE; MULTI-CRYSTALLINE SILICON SOLAR CELLS; P-TYPE; PASSIVATION PROPERTIES; POST TREATMENT; REAR SIDE; SOLAR-CELL APPLICATIONS;

EID: 78650114153     PISSN: 01608371     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/PVSC.2010.5614176     Document Type: Conference Paper
Times cited : (7)

References (16)
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  • 4
    • 74849138656 scopus 로고    scopus 로고
    • Influence of the deposition temperature on the c-Si surface passivation by Al2O3 Films synthesized by ALD and PECVD
    • G. Dingemans, M. C. C. van der Sanden, and W. M. M. Kessels, "Influence of the Deposition Temperature on the c-Si Surface Passivation by Al2O3 Films Synthesized by ALD and PECVD", Electrochemical and Solid-State Letters, 13, 3 2009, pp. H76- 79H.
    • (2009) Electrochemical and Solid-state Letters , vol.13 , Issue.3
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  • 5
    • 0036605313 scopus 로고    scopus 로고
    • Experimental evidence of parasitic shunting in silicon nitride rear surface passivated solar cells
    • S. Dauwe, L. Mittelstadt, A. Metz, and R. Hezel, "Experimental evidence of parasitic shunting in silicon nitride rear surface passivated solar cells", Prog. Photovoltaics, 10, 4, 2002, pp. 271-278.
    • (2002) Prog. Photovoltaics , vol.10 , Issue.4 , pp. 271-278
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  • 7
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    • Effective surface passivation of crystalline silicon by rf sputtered aluminum oxide
    • T. T. Li and A. Cuevas, "Effective surface passivation of crystalline silicon by rf sputtered aluminum oxide", Phys. Status Solidi RRL, 3, 5, 2009, pp. 160-162.
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  • 8
    • 74849138656 scopus 로고    scopus 로고
    • Influence of the deposition temperature on the c-Si surface passivation by Al2O3 Films synthesized by ALD and PECVD
    • G. Dingemans, M. C. C. van der Sanden, and W. M. M. Kessels, "Influence of the Deposition Temperature on the c-Si Surface Passivation by Al2O3 Films Synthesized by ALD and PECVD", Electrochemical and Solid-State Letters, 13, 3 2009, pp. H76- 79H.
    • (2009) Electrochemical and Solid-state Letters , vol.13 , Issue.3
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  • 9
    • 73949100676 scopus 로고    scopus 로고
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    • J. Schmidt, B. Veith, and R. Brendel, "Effective surface passivation of crystalline silicon using ultrathin Al2O3 films and Al2O3/SiNx stacks", Phys. Status Solidi RRL 3, 9, 2009, pp. 287-289.
    • (2009) Phys. Status Solidi RRL , vol.3 , Issue.9 , pp. 287-289
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  • 10
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    • Further improvements in surface modification of MC silicon solar cells: Comparison of different post- PSG cleans for inline emitters
    • A. Stassen, M. Koppes, and J. Hoogboom, "Further improvements in surface modification of MC silicon solar cells: comparison of different post- PSG cleans for inline emitters", Photovoltaic international, 6, 2009, p. 71.
    • (2009) Photovoltaic International , vol.6 , pp. 71
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  • 14
    • 78650147183 scopus 로고    scopus 로고
    • -3, 0.11 micron), wafer thickness of 188μm, base resistivity 1ohm.cm. No parallel cirquits elements were used in the model"
    • -3, 0.11 micron), wafer thickness of 188μm, base resistivity 1ohm.cm. No parallel cirquits elements were used in the model".


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.