-
1
-
-
1542329235
-
Modeling and estimation of total leakage current in nano-scaled CMOS devices considering the effect of parameter variation
-
S. Mukhopadhyay, K. Roy, "Modeling and estimation of total leakage current in nano-scaled CMOS devices considering the effect of parameter variation," in Proc. Int. Symp. Low Power Electronics and Design, 2003, pp. 172-175.
-
(2003)
Proc. Int. Symp. Low Power Electronics and Design
, pp. 172-175
-
-
Mukhopadhyay, S.1
Roy, K.2
-
2
-
-
50249162069
-
Soft-edge flip-flops for improved timing yield: Design and optimization
-
Nov.
-
Vivek Joshi, David Blaauw, Dennis Sylvester, "Soft-edge flip-flops for improved timing yield: design and optimization," in Proc. IEEE/ACM Int. Conf. Computer-Aided Design, Nov. 2007, pp. 667-673.
-
(2007)
Proc. IEEE/ACM Int. Conf. Computer-Aided Design
, pp. 667-673
-
-
Joshi, V.1
Blaauw, D.2
Sylvester, D.3
-
3
-
-
58149267845
-
Energy-efficient and metastability-immune resilient circuits for dynamic variation tolerance
-
Jan.
-
Keith A et al., "Energy-Efficient and Metastability-Immune Resilient Circuits for Dynamic Variation Tolerance," IEEE J. Solid-State Circuits, vol. 44, no. 1, pp. 49-63, Jan. 2009.
-
(2009)
IEEE J. Solid-State Circuits
, vol.44
, Issue.1
, pp. 49-63
-
-
Keith, A.1
-
4
-
-
84944408150
-
Razor: A low-power pipeline based on circuit-level timing speculation
-
Dec.
-
D. Ernst et al., "Razor: A low-power pipeline based on circuit-level timing speculation," in Proc. IEEE/ACM Int. Symp. Microarchitecture, Dec. 2003, pp. 7-18.
-
(2003)
Proc. IEEE/ACM Int. Symp. Microarchitecture
, pp. 7-18
-
-
Ernst, D.1
-
5
-
-
33645652998
-
A self-tuning DVS processor using delay-error detection and correction
-
Apr.
-
S. Das et al., "A Self-Tuning DVS Processor Using Delay-Error Detection and Correction," IEEE J. Solid-State Circuits, vol. 41, no. 4, pp.792-804, Apr. 2006.
-
(2006)
IEEE J. Solid-State Circuits
, vol.41
, Issue.4
, pp. 792-804
-
-
Das, S.1
-
6
-
-
58149218298
-
RazorII: In situ error detection and correction for PVT and SER tolerance
-
Jan.
-
S. Das et al., "RazorII: In Situ Error Detection and Correction for PVT and SER Tolerance," IEEE J. Solid-State Circuits, vol. 44, no. 1, pp.32-48, Jan. 2009.
-
(2009)
IEEE J. Solid-State Circuits
, vol.44
, Issue.1
, pp. 32-48
-
-
Das, S.1
-
8
-
-
0036858210
-
Adaptive body bias for reducing impacts of die-to-die and within-die parameter variations on microprocessor frequency and leakage
-
DOI 10.1109/JSSC.2002.803949
-
J. Tschanz et al., "Adaptive Body Bias for Reducing Impacts of Die-to-Die and Within-Die Parameter Variations on Microprocessor Frequency and Leakage," IEEE J. Solid-State Circuits, vol.37, no. 11, pp.1396-1402, Nov. 2002. (Pubitemid 35432159)
-
(2002)
IEEE Journal of Solid-State Circuits
, vol.37
, Issue.11
, pp. 1396-1402
-
-
Tschanz, J.W.1
Kao, J.T.2
Narendra, S.G.3
Nair, R.4
Antoniadis, D.A.5
Chandrakasan, A.P.6
De, V.7
-
9
-
-
1842477897
-
Going beyond worst-case specs with TEAtime
-
Mar.
-
A. K. Uht, "Going beyond Worst-case Specs with TEAtime", IEEE Computer, vol.37, no.3, pp 51-56, Mar. 2004.
-
(2004)
IEEE Computer
, vol.37
, Issue.3
, pp. 51-56
-
-
Uht, A.K.1
-
10
-
-
34548812547
-
Adaptive frequency and biasing techniques for tolerance to dynamic temperature-voltage variations and aging
-
Feb.
-
J. Tschanz, N.-S. Kim, S. Dighe et al., "Adaptive Frequency and Biasing Techniques for Tolerance to Dynamic Temperature-Voltage Variations and Aging," in IEEE Int. Solid-States Circuits Conf. Dig. Tech. Papers, Feb. 2007, pp. 292-293.
-
(2007)
IEEE Int. Solid-States Circuits Conf. Dig. Tech. Papers
, pp. 292-293
-
-
Tschanz, J.1
Kim, N.-S.2
Dighe, S.3
-
11
-
-
34548854756
-
A distributed critical-path timing monitor for a 65 nm high-performance microprocessor
-
Feb.
-
A. Drake et al., "A distributed critical-path timing monitor for a 65 nm high-performance microprocessor," in IEEE Int. Solid-States Circuits Conf. Dig. Tech. Papers, Feb. 2007, pp. 398-399.
-
(2007)
IEEE Int. Solid-States Circuits Conf. Dig. Tech. Papers
, pp. 398-399
-
-
Drake, A.1
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