Dynamic NBTI management using a 45nm multi-degradation sensor

Proceedings of the Custom Integrated Circuits Conference

Volumn , Issue , 2010, Pages

  Singh, Prashant ^a   Karl, Eric ^b   Sylvester, Dennis ^a   Blaauw, David ^a  

^a UNIVERSITY OF MICHIGAN   (United States)

^b INTEL CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AREA OVERHEAD; CELL POWER CONSUMPTION; LOW POWER; OPERATING CONDITION; PROCESS NODES; RELIABILITY MONITORING; SENSOR DEPLOYMENT; SENSOR DYNAMIC; SUPPLY VOLTAGES; TOTAL BUDGET; WORST CASE;

DEGRADATION; INTEGRATED CIRCUIT MANUFACTURE; SENSORS;

INTEGRATED CIRCUITS;

EID: 78649878382     PISSN: 08865930     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/CICC.2010.5617412     Document Type: Conference Paper

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