An all-in-one silicon odometer for separately monitoring HCI, BTI, and TDDB

IEEE Symposium on VLSI Circuits, Digest of Technical Papers

Volumn , Issue , 2009, Pages 108-109

  Keane, John ^a   Persaud, Devin ^a   Kim, Chris H ^a  

^a University of Minnesota   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AGING EFFECTS; BEAT FREQUENCY; MEASUREMENT RESULTS; MEASUREMENT TIME; ON CHIPS; RING OSCILLATOR; STRESS CONDITION; TEST CHIPS;

ELECTRIC CURRENTS; OSCILLATORS (ELECTRONIC);

VLSI CIRCUITS;

EID: 70449348020     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (2)

1. T. H. Kim, et al., JSSC, vol. 43, no. 4, pp. 874-880, April 2008.
2. E. Karl, et al., ISSCC, pp. 410-411, 2008.