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Scanned beam uniformity control in the VIISta 810 ion implanter
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J.C. Olson, A. Renau and J. Buff, "Scanned Beam Uniformity Control in the VIISta 810 Ion Implanter," 1998 Int'l Conf. on Ion Implantation Tech. Proceedings, pp. 169-172,1999. (Pubitemid 30520183)
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The core implanter for 300-mm wafers: IW-630
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5
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78649826672
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Nissin EXCEED2000 - A new high performance medium current implanter
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T. Kawai, M.Naito, M.Tanjyo, N.Nagai, H. Kumasaki, K. Nishikawa et al., "Nissin EXCEED2000 - A New High Performance Medium Current Implanter," Proceedings of the Tenth Int 'I Conf. on Ion Implantation Tech., pp. 470-473, 1995.
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33847004606
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The NISSIN NH-20SP medium-current ion implanter
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N. Nagai, T. Kawai, M. Nogami, T. Yuasa, Y. Kibi, H. Kawakami et al., "The NISSIN NH-20SP medium-current ion implanter," Nucl. Instr. And Meth vol. B55, pp. 393-397, 1991.
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Kawakami, H.6
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7
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Energy contamination from multiple-charged ion implantation in conventional implanter
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T. Kubo, T. Hisaeda, T. Miyake, T. Ishigami, M. Kase, K. Watanabe and T. Fukuda, "Energy contamination from multiple-charged ion implantation in conventional implanter," Proceedings of the Eleventh Int 7 Conf. On Ion Implantation Tech, pp. 100-103,1997.
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9
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0030348767
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Productivity brush-up of the nissin EXCEED2000 medium current implanter
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N. Nagai, M. Naito, T. Matsumoto, K. Nishikawa, K. Iwasawa, Y. Nishigami et al., "Productivity Brush-up of the Nissin EXCEED2000 Medium Current Implanter," Proceedings of the Eleventh Int 'I Conf. on Ion Implantation Tech, pp. 462-465, 1997.
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Nishigami, Y.6
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H. Fujisawa, T. Yamashita, S. Ishida, N. Hamamoto, N. Miyamoto, K. Miyabayashi and T. Nagayama, "Indium Beam Implantation," these proceedings.
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Miyabayashi, K.6
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M. Tanjyo, S. Sakai, T. Ikejiri, K. Nakao, and T. Nagayama, "Performance of a Plasma Flood Gun in the Medium Current Ion Implanter Exceed2000A," these proceedings.
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Performance of A Plasma Flood Gun in the Medium Current Ion Implanter Exceed2000A
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Nagayama, T.5
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