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Volumn 54, Issue 1, 2005, Pages 53-57

Accelerated life tests at higher usage rates

Author keywords

Accelerated life test; Compromise test plan; Sensitivity analysis; Usage effect; Usage rate

Indexed keywords

MATHEMATICAL MODELS; MAXIMUM LIKELIHOOD ESTIMATION; PARAMETER ESTIMATION; PROBABILITY DISTRIBUTIONS; SENSITIVITY ANALYSIS; STATISTICAL METHODS;

EID: 15544376231     PISSN: 00189529     EISSN: None     Source Type: Journal    
DOI: 10.1109/TR.2004.841730     Document Type: Article
Times cited : (35)

References (11)
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    • presented at [Online]. Available: WNconsultαol.com
    • W. B. Nelson. A bibliography of accelerated test plans, presented at Proc. 9th ISSAT Int. Conf. Reliab. Qual. Design. [Online]. Available: WNconsultαol.com
    • Proc. 9th ISSAT Int. Conf. Reliab. Qual. Design
    • Nelson, W.B.1
  • 4
    • 0031335970 scopus 로고    scopus 로고
    • "Effect of switching rate on contact failure from contact resistance of micro relay under environment containing silicone vapor"
    • T. Tamai, K. Miyagawa, and M. Furukawa, "Effect of switching rate on contact failure from contact resistance of micro relay under environment containing silicone vapor," in Proc. 43rd IEEE Holm Conf. Electrical Contacts, 1997, pp. 333-339.
    • (1997) Proc. 43rd IEEE Holm Conf. Electrical Contacts , pp. 333-339
    • Tamai, T.1    Miyagawa, K.2    Furukawa, M.3
  • 7
    • 0242389859 scopus 로고
    • "Planning accelerated life tests with two or more experimental factors"
    • L. A. Escobar and W. Q. Meeker, "Planning accelerated life tests with two or more experimental factors," Technometrics, vol. 37, no. 4, pp. 411-427, 1995.
    • (1995) Technometrics , vol.37 , Issue.4 , pp. 411-427
    • Escobar, L.A.1    Meeker, W.Q.2
  • 8
    • 0021427118 scopus 로고
    • "A comparison of accelerated life test plans for Weibull and lognormal distributions and Type I censoring"
    • W. Q. Meeker, "A comparison of accelerated life test plans for Weibull and lognormal distributions and Type I censoring," Technometrics, vol. 26, no. 2, pp. 157-171, 1984.
    • (1984) Technometrics , vol.26 , Issue.2 , pp. 157-171
    • Meeker, W.Q.1
  • 9
    • 0036891325 scopus 로고    scopus 로고
    • "Accelerated degradation-tests with tightened critical values"
    • G. Yang and K. Yang, "Accelerated degradation-tests with tightened critical values," IEEE Trans. Reliab., vol. 51, pp. 463-468,2002.
    • (2002) IEEE Trans. Reliab. , vol.51 , pp. 463-468
    • Yang, G.1    Yang, K.2
  • 10
    • 0028730662 scopus 로고
    • "Optimum constant-stress accelerated life-test plans"
    • G. Yang, "Optimum constant-stress accelerated life-test plans," IEEE Trans. Reliab., vol. 43, pp. 575-581, 1994.
    • (1994) IEEE Trans. Reliab. , vol.43 , pp. 575-581
    • Yang, G.1
  • 11
    • 4243681949 scopus 로고
    • "Fisher information matrix for the extreme value, normal and logistic distributions and censored data"
    • L. A. Escobar and W. Q. William, "Fisher information matrix for the extreme value, normal and logistic distributions and censored data," Appl. Statist., vol. 43, no. 3, pp. 533-540, 1994.
    • (1994) Appl. Statist. , vol.43 , Issue.3 , pp. 533-540
    • Escobar, L.A.1    William, W.Q.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.