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Volumn 11, Issue 17, 2010, Pages 3609-3616

High-Resolution Surface Chemical Analysis of a Trifunctional Pattern Made by Sequential Colloidal Shadowing

Author keywords

Colloidal assembly; Mass spectrometry; Self assembly; Surface analysis; X ray photoelectron spectroscopy (xps)

Indexed keywords

CHEMICAL ANALYSIS; CHEMICAL MODIFICATION; COLLOIDS; GOLD COATINGS; GOLD DEPOSITS; IONS; LUNAR SURFACE ANALYSIS; MASS SPECTROMETRY; ORGANIC POLYMERS; PARTICLE SIZE ANALYSIS; PHOTOELECTRONS; PHOTONS; PHYSICAL VAPOR DEPOSITION; PLASMA ETCHING; SECONDARY EMISSION; SECONDARY ION MASS SPECTROMETRY; SELF ASSEMBLY; SILICA; SURFACE ANALYSIS; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 78649754956     PISSN: 14394235     EISSN: 14397641     Source Type: Journal    
DOI: 10.1002/cphc.201000737     Document Type: Article
Times cited : (12)

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    • D. Briggs, J. T. Grant, Surface Analysis by Auger and X-Ray Photoelectron Spectroscopy, IM Publications, Chichester 2003.
    • (2003)
    • Briggs, D.1    Grant, J.T.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.