Serial and parallel dip-pen nanolithography using a colloidal probe Tip

Journal of the American Chemical Society

Volumn 132, Issue 13, 2010, Pages 4532-4533

  Kramer, Marcus A ^a   Jaganathan, Hamsa ^a   Ivanisevic, Albena ^a,b  

^a PURDUE UNIVERSITY   (United States)

^b PURDUE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AFM TIP; COLLOIDAL PROBES; DIFFERENT SUBSTRATES; DIP-PEN NANOLITHOGRAPHY; HUMIDITY CONDITIONS; PARALLEL MODE;

NANOLITHOGRAPHY;

DIMETICONE; GOLD; MICROSPHERE; SILICON; SILOXANE;

ARTICLE; ATOMIC FORCE MICROSCOPY; COLLOID; HUMIDITY; METHODOLOGY; NANOLITHOGRAPHY;

COLLOIDS; DIMETHYLPOLYSILOXANES; ELECTROCHEMISTRY; HUMIDITY; MICROSCOPY, ATOMIC FORCE; NANOTECHNOLOGY; PARTICLE SIZE; POLYMETHYL METHACRYLATE; SURFACE PROPERTIES;

EID: 77950849525     PISSN: 00027863     EISSN: 15205126     Source Type: Journal    
DOI: 10.1021/ja1003137     Document Type: Article

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