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Volumn , Issue , 2010, Pages 321-324
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Design and manufacturing of wideband buried RF feedthroughs for wafer-level RF MEMS package
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Author keywords
[No Author keywords available]
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Indexed keywords
AVERAGE LOSS;
CPW LINE;
FREQUENCY BAND WIDTH;
GOLD RINGS;
LOW LOSS;
METAL SEALING;
ON-WAFER;
PARASITIC CAPACITANCE;
RF APPLICATIONS;
RF CHARACTERIZATION;
RF MEASUREMENTS;
RF PERFORMANCE;
RF-MEMS;
SIMULATED DATA;
WAFER LEVEL;
WIDE-BAND;
ZERO-LEVEL PACKAGING;
ELECTRONICS PACKAGING;
FREQUENCY BANDS;
MANUFACTURE;
SEALING (CLOSING);
WAFER BONDING;
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EID: 78649618844
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (4)
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References (5)
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