Ultraviolet emission and electrical properties of aluminum-doped zinc oxide thin films with preferential C-Axis orientation

Journal of the American Ceramic Society

Volumn 93, Issue 10, 2010, Pages 3291-3298

  Zhang, Daoli ^a,b   Zhang, Jianbing ^a,b   Cheng, Youguang ^a   Yuan, Lin ^a   Miaoz, Xiangshui ^a,b  

^a HUAZHONG UNIVERSITY OF SCIENCE AND TECHNOLOGY   (China)

^b HUAZHONG UNIVERSITY OF SCIENCE AND TECHNOLOGY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM-DOPED ZINC OXIDE; ANNEALING TREATMENTS; AZO FILMS; AZO THIN FILMS; C-AXIS ORIENTATIONS; ELECTRICAL PROPERTY; EMISSION PEAKS; FLOAT GLASS SUBSTRATES; FOUR-POINT PROBE; GROWTH ORIENTATIONS; OPTICAL AND ELECTRICAL PROPERTIES; ROOM-TEMPERATURE PHOTOLUMINESCENCE; SOL GEL DIP COATING; TRANSMISSION SPECTRUMS; ULTRAVIOLET EMISSION; VISIBLE REGION;

ALUMINUM; ALUMINUM COATINGS; ELECTRIC PROPERTIES; PHOTOLUMINESCENCE; SUBSTRATES; THIN FILMS; VAPOR DEPOSITION; ZINC; ZINC COATINGS; ZINC OXIDE;

OXIDE FILMS;

EID: 78649573464     PISSN: 00027820     EISSN: 15512916     Source Type: Journal    
DOI: 10.1111/j.1551-2916.2010.03847.x     Document Type: Article

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