Electron microscopy studies of electron-beam sensitive PbTe-based nanostructures

Microscopy Research and Technique

Volumn 73, Issue 10, 2010, Pages 944-951

  Falqui, Andrea ^a   Bertoni, Giovanni ^a   Genovese, Alessandro ^a   Marras, Sergio ^a   Malerba, Mario ^a   Franchini, Isabella R ^a,b   Manna, Liberato ^a  

^a ISTITUTO ITALIANO DI TECNOLOGIA   (Italy)

^b NATIONAL NANOTECHNOLOGY LABORATORY   (Italy)

Author keywords

Cs corrected high resolution transmission electron microscopy; Energy dispersive x ray spectrometry; PbTe; Quantum dots; Scanning transmission electron microscopy

Indexed keywords

CESIUM COMPOUNDS; ELECTRON BEAMS; ELECTRONS; GOLD COMPOUNDS; GOLD NANOPARTICLES; IV-VI SEMICONDUCTORS; LEAD COMPOUNDS; NANOCRYSTALS; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTOR QUANTUM DOTS; SPECTROMETRY; SURFACE DEFECTS; TELLURIUM COMPOUNDS;

CS-CORRECTED HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; ELECTRON-BEAM; ENERGY DISPERSIVE X-RAY SPECTROMETRY; HIGH-RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; QUANTUM DOT; REACTION CONDITIONS; SCANNING TRANSMISSION ELECTRON MICROSCOPY; SINGLE DEFECT; SYNTHESISED; TOLUENE SOLUTION;

HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY;

BASIDIOMYCOTA;

EID: 78649473617     PISSN: 1059910X     EISSN: 10970029     Source Type: Journal    
DOI: 10.1002/jemt.20843     Document Type: Article

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