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Materials Research Bulletin

Volumn 45, Issue 12, 2010, Pages 1973-1977

A study of structural transition in nanocrystalline titania thin films by X-ray diffraction Rietveld method

(5) Murugesan, S a Padhy, N a Kuppusami, P a Mudali, U Kamachi a Mohandas, E a

a INDIRA GANDHI CENTRE FOR ATOMIC RESEARCH (India)

Author keywords

A. Oxides; B. Thin films; C. Laser deposition; D. X ray diffraction; E. Microstructure

Indexed keywords

A. OXIDES; ANATASE FILMS; B. THIN FILMS; C. LASER DEPOSITION; E. MICROSTRUCTURE; FRACTIONAL COORDINATES; MICROSTRUCTURAL ANALYSIS; NANOCRYSTALLINE TITANIA; OXYGEN PARTIAL PRESSURE; ROOT MEAN SQUARE; RUTILE AND ANATASE; RUTILE FILMS; STRUCTURAL TRANSITIONS; TITANIA FILMS;

CRYSTALLITE SIZE; DIFFRACTION; MICROSTRUCTURE; NANOCRYSTALLINE ALLOYS; OXIDE MINERALS; OXYGEN; PARTIAL PRESSURE; PHASE TRANSITIONS; POSITIVE IONS; PULSED LASER DEPOSITION; PULSED LASERS; RIETVELD METHOD; THIN FILMS; TITANIUM DIOXIDE; VAPOR DEPOSITION; X RAY DIFFRACTION; X RAYS;

DEPOSITION;

EID: 78649323853 PISSN: 00255408 EISSN: None Source Type: Journal
DOI: 10.1016/j.materresbull.2010.08.010 Document Type: Article

Times cited : (8)

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