Rietveld X-ray diffraction analysis of nanostructured rutile films of titania prepared by pulsed laser deposition

Materials Research Bulletin

Volumn 45, Issue 1, 2010, Pages 6-9

  Murugesan, S ^a   Kuppusami, P ^a   Mohandas, E ^a  

^a INDIRA GANDHI CENTRE FOR ATOMIC RESEARCH   (India)

Author keywords

A. Oxides; B. Laser deposition; C. X ray diffraction; D. Microstructure

Indexed keywords

A. OXIDES; B. LASER DEPOSITION; C. X-RAY DIFFRACTION; D. MICROSTRUCTURE; LATTICE PARAMETERS; NANOSTRUCTURED RUTILE; POWDER X RAY DIFFRACTION; RIETVELD; RUTILE FILMS; RUTILE STRUCTURE; SUBSTRATE TEMPERATURE;

CRYSTAL STRUCTURE; CRYSTALLITE SIZE; DIFFRACTION; FILM PREPARATION; LASERS; MICROSTRUCTURE; OXIDE FILMS; OXIDE MINERALS; OXYGEN; PULSED LASER DEPOSITION; RIETVELD ANALYSIS; TITANIUM; TITANIUM DIOXIDE; TITANIUM OXIDES; X RAY DIFFRACTION;

X RAY DIFFRACTION ANALYSIS;

EID: 70449108120     PISSN: 00255408     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.materresbull.2009.09.012     Document Type: Article

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