SCOPUS 정보 검색 플랫폼

IEEE International Symposium on Electromagnetic Compatibility

Volumn 3, Issue , 2005, Pages 695-699

On the prediction of near-field microcontroller emission

(3) Sicard, E a Boyer, A a Tankielun, A b

a INSA (France)

b IZM (Germany)

Author keywords

Dipole; IC; Near field scanning; Parasitic emission

Indexed keywords

CMOS INTEGRATED CIRCUITS; COMPUTER SIMULATION; ELECTRIC CURRENTS; ELECTROMAGNETISM; INDUCTANCE; MAGNETIC FIELD EFFECTS; MATHEMATICAL MODELS; PREDICTIVE CONTROL SYSTEMS; RADIATION EFFECTS;

DIPOLES; NEAR-FIELD ELECTROMAGNETIC FORMULATIONS; NEAR-FIELD SCANNING; PARASITIC EMISSIONS;

MICROCONTROLLERS;

EID: 33746650554 PISSN: 10774076 EISSN: None Source Type: Conference Proceeding
DOI: 10.1109/ISEMC.2005.1513613 Document Type: Conference Paper

Times cited : (8)

References (9)

1
- 24044506327
- IEC standard
- International Electro-technical Commission "IEC 61967: Integrated Circuits, Measurements of Conducted and Radiated Electromagnetic Emission", IEC standard, 2001, www.iec.ch
- (2001) IEC 61967: Integrated Circuits, Measurements of Conducted and Radiated Electromagnetic Emission

2
- 33746624980
- IEC standard
- International Electro-technical Commission "IEC 62014-3: Models of integrated circuits for EMI behavioural simulation", IEC standard, 2002, www.iec.ch
- (2002) IEC 62014-3: Models of Integrated Circuits for EMI Behavioural Simulation

3
- 0033220953
- Near-field measurements of VLSI devices
- K. P Slattery, J. Neal, W. Cui "Near-field Measurements of VLSI devices", IEEE Transaction on EMC, 41, 4, pp 374-384, 1999
- (1999) IEEE Transaction on EMC , vol.41 , Issue.4 , pp. 374-384
- Slattery, K.P.¹ Neal, J.² Cui, W.³

4
- 4644253613
- CESAME: A test chip for the validation of a parasitic emission prediction flow in 0.18um CMOS technology
- 9-13 Aug.
- B. Vrignon, S. Bendhia, L. Courau, E. Sicard, "CESAME: a test chip for the validation of a parasitic emission prediction flow in 0.18um CMOS technology", 2004 IntemationalSymposium on Electromagnetic Compatibility, 9-13 Aug. 2004, Pages:372-376 vol.2
- (2004) 2004 IntemationalSymposium on Electromagnetic Compatibility , vol.2 , pp. 372-376
- Vrignon, B.¹ Bendhia, S.² Courau, L.³ Sicard, E.⁴

5
- 33746627460
- In-fluence of core optimisation and activity for electromagnetic near-field and conducted emissions of CESAME test chip
- Angers, France
- A. Tankielun, P. Kralicek, U. Keller, E. Sicard, B. Vrignon "In-fluence of Core Optimisation and Activity for Electromagnetic Near-Field and Conducted Emissions of CESAME Test Chip", 4th International Workshop on EMC of Integrated Circuits, (EMC Compo 04) Angers, France, 2004
- (2004) 4th International Workshop on EMC of Integrated Circuits, (EMC Compo 04)
- Tankielun, A.¹ Kralicek, P.² Keller, U.³ Sicard, E.⁴ Vrignon, B.⁵

6
- 33746619877
- The IBIS group web site is http://www.eigroup.org/ibis

7
- 33746590948
- A Windows version of Berkeley SPICE is available at www.winspice.com
- A Windows Version of Berkeley SPICE

8
- 33746619453
- The SCILAB software may be download from http://scilabsoft.inria.fr/
- The SCILAB Software

9
- 33746634564
- March
- ASERIS-EMC2000 v3.7, Documentation Manual, March 2004, http://www.aseris-emc2000.org
- (2004) ASERIS-EMC2000 v3.7, Documentation Manual

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.