Modeling the electromagnetic emission of a microcontroller using a single model

IEEE Transactions on Electromagnetic Compatibility

Volumn 50, Issue 1, 2008, Pages 22-34

  Labussière Dorgan, Cécile ^a,b   Bendhia, Sonia ^c   Sicard, Etienne ^c   Tao, Junwu ^d   Jorge Quaresma, Henrique ^e   Lochot, Christophe ^a,f   Vrignon, Bertrand ^a  

^a FREESCALE SEMICONDUCTOR INC   (United States)

^b Delegation Generale pour l'Armement   (France)

^c INSA   (France)

^d Electrical Engineering Hydraulics Computer Sciences and Telecommunications   (France)

^e INSTITUTO DE TELECOMUNICAÇÕES   (Portugal)

^f AIRBUS   (France)

Author keywords

Conducted emission; Electromagnetic compatibility (EMC); Integrated circuit (IC); Integrated circuit emission model (ICEM); Measurement standards; Microcontroller; Radiated emission

Indexed keywords

ELECTROMAGNETIC COMPATIBILITY; ELECTROMAGNETIC WAVE EMISSION; INTEGRATED CIRCUITS; MATHEMATICAL MODELS; SCATTERING PARAMETERS;

INTEGRATED CIRCUIT EMISSION MODEL (ICEM); RADIATED EMISSION;

MICROCONTROLLERS;

EID: 40949133830     PISSN: 00189375     EISSN: None     Source Type: Journal    
DOI: 10.1109/TEMC.2007.911918     Document Type: Article

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