SnxSy compounds growth by controlled sulfurisation of SnO2

Journal of Alloys and Compounds

Volumn 509, Issue 3, 2011, Pages 929-935

  Khelia, C ^a   Boubaker, K ^a   Amlouk, M ^a  

^a FACULTÉ DES SCIENCES DE TUNIS   (Tunisia)

Author keywords

Boubaker Polynomials Expansion Scheme BPES; Optical properties; Sulfurisation; Thin film

Indexed keywords

GROWTH KINETICS; IV-VI SEMICONDUCTORS; LAYERED SEMICONDUCTORS; OPTICAL DATA PROCESSING; OPTICAL PROPERTIES; REFRACTIVE INDEX; SEMICONDUCTING GLASS; SEMICONDUCTING TIN COMPOUNDS; SUBSTRATES; THIN FILMS; TIN OXIDES;

ANNEALING TEMPERATURES; ELECTRONIC TRANSITION; EXTINCTION COEFFICIENTS; OPTICAL MEASUREMENT; POLYNOMIALS EXPANSION; REFLECTANCE SPECTRUM; STRUCTURAL STUDIES; SULFURISATION;

SULFUR COMPOUNDS;

EID: 78449255003     PISSN: 09258388     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jallcom.2010.09.132     Document Type: Article

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