Effect of gallium focused ion beam milling on preparation of aluminium thin foils

Journal of Microscopy

Volumn 240, Issue 3, 2010, Pages 227-238

  Unocic, K A ^a   Mills, M J ^b   Daehn, G S ^b  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

^b OHIO STATE UNIVERSITY   (United States)

Author keywords

Aluminium alloys; FIB; Ga effect; TEM sample preparation

Indexed keywords

FOCUSED ION BEAMS; GRAIN BOUNDARIES; IONS; MILLING (MACHINING); TRANSMISSION ELECTRON MICROSCOPY;

ATOM PROBE; FIB; FOCUSED ION BEAM MILLING; FOCUSSED ION BEAM MILLINGS; FOCUSSED ION-BEAMS; GA EFFECT; GALLIUM FOCUSED ION BEAMS; TEM SAMPLE PREPARATION; THIN FOIL; TRANSMISSION ELECTRON;

GALLIUM;

ALUMINUM; GALLIUM;

ARTICLE; ATOM; ELECTRON; ENERGY; PRIORITY JOURNAL; TRANSMISSION ELECTRON MICROSCOPY;

EID: 78449242371     PISSN: 00222720     EISSN: 13652818     Source Type: Journal    
DOI: 10.1111/j.1365-2818.2010.03401.x     Document Type: Article

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