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Volumn 166, Issue 2, 2008, Pages 42-43
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Jacquet-Lucas Award: TEM sample preparation method for grain boundary phase identification in Al-Mg alloys
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Author keywords
[No Author keywords available]
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Indexed keywords
COMMINUTION;
CORROSION;
GRAIN BOUNDARIES;
ION BEAMS;
PHASE INTERFACES;
TRANSMISSION ELECTRON MICROSCOPY;
FOCUSED ION BEAM MILLING;
MACROSCOPIC INTERGRANULAR CORROSION;
ALUMINUM ALLOYS;
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EID: 42249096740
PISSN: 08827958
EISSN: None
Source Type: Trade Journal
DOI: None Document Type: Article |
Times cited : (1)
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References (0)
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