Accessing OLED emitter properties by radiation pattern analyses

Organic Electronics

Volumn 12, Issue 1, 2011, Pages 83-91

  Flämmich, Michael ^a   Michaelis, Dirk ^a   Danz, Norbert ^a  

^a FRAUNHOFER INSTITUTE FOR APPLIED OPTICS AND PRECISION ENGINEERING   (Germany)

Author keywords

Dipole emitter orientation; Emission zone; In situ characterization; Internal spectrum; Optical simulation; Organic light emitting diode

Indexed keywords

ELECTROLUMINESCENCE; ELECTRONIC EQUIPMENT; LIGHT; OPTICAL PROPERTIES;

ELECTROLUMINESCENCE SPECTRA; EMISSION ZONE; EMISSIVE MATERIALS; IN-SITU CHARACTERIZATION; INTERNAL SPECTRUM; OPTICAL SIMULATION; ORGANIC LIGHT EMITTING DIODES(OLEDS); PRECISE MEASUREMENTS;

ORGANIC LIGHT EMITTING DIODES (OLED);

EID: 78249280313     PISSN: 15661199     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.orgel.2010.09.019     Document Type: Article

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27. At this point it is worth noting that Eq. (4) supports different types of ensemble-averaging methods regarding the orientation of the dipole transition moment, where the particular character of the emissive species is accounted in the detailed calculation of Γrel (q, z, ) [16]. In this contribution, we assume the orientation of the dipole transition moment to be fixed during the process of emission. However, applying different ensemble-averaging methods typically results in small quantitative differences only, which have no qualitative impact on the considerations we present.
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