Analysis of the emission profile in organic light-emitting devices

Optics Express

Volumn 18, Issue 102, 2010, Pages A246-A260

  Perucco, B ^a,b   Reinke, N A ^b   Rezzonico, D ^a   Moos, M ^b   Ruhstaller, B ^a,b  

^a FLUXIM AG   (Switzerland)

^b FOM Institute AMOLF2Zurich University of Applied Sciences   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; CURRENT DENSITY; EMISSION SPECTROSCOPY; EXTRACTION; LIGHT EMISSION; OPTOELECTRONIC DEVICES;

CONSISTENCY CHECKS; DEVICE PARAMETERS; ELECTRONIC SIMULATION; EMISSION PROFILE; EMISSION SPECTRUMS; FITTING METHOD; LINEAR METHODS; MODEL PARAMETERS; NON-LINEAR METHODS; NONLINEAR FITTING METHOD; NUMERICAL ALGORITHMS; NUMERICAL MODELS; OPTOELECTRONIC MATERIALS; ORGANIC LIGHT-EMITTING DEVICES; PRACTICAL USE; SOURCE SPECTRUM;

NUMERICAL METHODS;

EID: 77953838487     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.18.00A246     Document Type: Article

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