Dispersion-model-free determination of optical constants: Application to materials for organic thin film devices

Applied Optics

Volumn 48, Issue 8, 2009, Pages 1507-1513

  Flämmich, Michael ^a   Danz, Norbert ^a   Michaelis, Dirk ^a   Bräuer, Andreas ^a   Gather, Malte C ^b   Kremer, Jonas H W M ^b   Meerholz, Klaus ^b  

^a FRAUNHOFER INSTITUTE FOR APPLIED OPTICS AND PRECISION ENGINEERING   (Germany)

^b UNIVERSITY OF COLOGNE   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

DISPERSION (WAVES); DISPERSIONS; ELECTROLUMINESCENCE; FILM THICKNESS; INTERFACES (MATERIALS); LIGHT EMITTING DIODES; ORGANIC LIGHT EMITTING DIODES (OLED); REFRACTIVE INDEX; SURFACE ROUGHNESS; THIN FILM CIRCUITS; THIN FILM DEVICES;

ELECTROLUMINESCENT POLYMERS; EXTINCTION COEFFICIENTS; HOMOGENEOUS AND ISOTROPIC; ORGANIC LIGHT EMITTING DIODES(OLEDS); ORGANIC PHOTOVOLTAIC (OPV); ORGANIC THIN-FILM DEVICES; PARALLEL INTERFACES; REFLECTION AND TRANSMISSION;

THIN FILMS;

EID: 62549083724     PISSN: 1559128X     EISSN: 15394522     Source Type: Journal    
DOI: 10.1364/AO.48.001507     Document Type: Article

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