Measuring the internal luminescence quantum efficiency of OLED emitter materials in electrical operation

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 7617, Issue , 2010, Pages

  Flämmich, Michael ^a   Danz, Norbert ^a   Michaelis, Dirk ^a   Wächter, Christoph A ^a   Bräuer, Andreas H ^a   Gather, Malte C ^b   Meerholz, Klaus ^b  

^a FRAUNHOFER INSTITUTE FOR APPLIED OPTICS AND PRECISION ENGINEERING   (Germany)

^b UNIVERSITY OF COLOGNE   (Germany)

Author keywords

Luminescence quantum efficiency; Optical characterization; Optical simulation; Organic light emitting diode

Indexed keywords

CATHODE DISTANCES; CURRENT EFFICIENCY; DIFFERENT MODES; EMITTED RADIATION; EMITTER MATERIALS; EMITTING MATERIAL; IN-SITU; LAYERED SYSTEMS; LUMINESCENCE QUANTUM EFFICIENCY; OPTICAL CHARACTERIZATION; OPTICAL SIMULATION; OVERALL EFFICIENCY; PERFORMANCE PARAMETERS; PHOTOLUMINESCENCE MEASUREMENTS; SURFACE PLASMONS;

DIODES; LIGHT; LIGHT EMITTING DIODES; LIGHTING; LUMINESCENCE; OPTICAL PROPERTIES; ORGANIC LIGHT EMITTING DIODES (OLED); SOLID STATE DEVICES;

QUANTUM EFFICIENCY;

EID: 77951664912     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.842114     Document Type: Conference Paper

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