High-performance soft x-ray spectromicroscopy beamline at SSRF

Review of Scientific Instruments

Volumn 81, Issue 10, 2010, Pages

  Xue, Chaofan ^a   Wang, Yong ^a   Guo, Zhi ^a   Wu, Yanqing ^a   Zhen, Xiangjun ^a   Chen, Min ^a   Chen, Jiahua ^a   Xue, Song ^a   Peng, Zhongqi ^b   Lu, Qipeng ^b   Tai, Renzhong ^a  

^a SHANGHAI INSTITUTE OF APPLIED PHYSICS   (China)

^b CHANGCHUN INSTITUTE OF OPTICS   (China)

Author keywords

[No Author keywords available]

Indexed keywords

A-PLANE; BEAM LINES; ELECTRON ENERGIES; END STATIONS; FIRST CONSTRUCTIONS; RESOLVING POWER; SHANGHAI SYNCHROTRON RADIATION FACILITIES; SOFT X-RAY SPECTROMICROSCOPY; SPATIAL RESOLUTION; THIRD GENERATION; UNDULATORS;

ARGON; LIGHT SOURCES; SYNCHROTRONS; X RAY LITHOGRAPHY; X RAY MICROSCOPES;

X RAYS;

EID: 78149438445     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3491837     Document Type: Conference Paper

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