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Volumn 17, Issue 6, 2010, Pages 804-809

Ratio-contrast imaging of dual-energy absorption for element mapping with a scanning transmission X-ray microscope

Author keywords

element microanalysis; X ray absorption edge; X ray microscopy

Indexed keywords

ABSORPTION EDGES; ABSORPTION IMAGES; CONTRAST IMAGING; CONTRAST THRESHOLD; DETECTION OF CHEMICALS; ELEMENT MAPPING; ELEMENT MICROANALYSIS; SHANGHAI SYNCHROTRON RADIATION FACILITIES; SPATIAL RESOLUTION; SUBTRACTION METHOD; X RAY MICROSCOPY;

EID: 77958589214     PISSN: 09090495     EISSN: 16005775     Source Type: Journal    
DOI: 10.1107/S0909049510031250     Document Type: Article
Times cited : (46)

References (22)
  • 1
    • 84904327702 scopus 로고
    • Beer, A. (1852). Ann. Phys. 86, 78-88.
    • (1852) Ann. Phys. , vol.86 , pp. 78-88
    • Beer, A.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.