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Volumn 95, Issue 1, 2011, Pages 231-234
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Determination of Cu(In1-xGax)3Se 5 defect phase in MBE grown Cu(In1-xGax)Se 2 thin film by Rietveld analysis
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Author keywords
Cu(In1 xGax)3Se5; Quantitative phase analysis; Rietveld method
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Indexed keywords
CU(IN1-XGAX)3SE5;
QUANTITATIVE PHASE ANALYSIS;
RIETVELD;
ROOM TEMPERATURE;
SODA LIME GLASS SUBSTRATE;
SOLAR CELL PERFORMANCE;
SPACE GROUPS;
X RAY DATA;
CRYSTAL STRUCTURE;
DEFECTS;
GALLIUM;
RIETVELD ANALYSIS;
RIETVELD METHOD;
RIETVELD REFINEMENT;
SEMICONDUCTING SELENIUM COMPOUNDS;
SUBSTRATES;
THIN FILMS;
COPPER;
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EID: 78149361012
PISSN: 09270248
EISSN: None
Source Type: Journal
DOI: 10.1016/j.solmat.2010.04.026 Document Type: Conference Paper |
Times cited : (16)
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References (19)
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