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Physical Review B - Condensed Matter and Materials Physics

Volumn 82, Issue 16, 2010, Pages

Direct measurement and analysis of the conduction band density of states in diluted GaAs1-xNx alloys

(12) Ivanova, L a Eisele, H a Vaughan, M P b Ebert, Ph c Lenz, A a Timm, R a Schumann, O d,e Geelhaar, L d,f Dahne M a Fahy, S b,g Riechert, H d,f O'Reilly, E P b

a TECHNISCHE UNIVERSITÄT BERLIN (Germany)

b UNIVERSITY COLLEGE CORK (Ireland)

c FORSCHUNGSZENTRUM JÜLICH (Germany)

d INFINEON TECHNOLOGIES AG (Germany)

e CARL ZEISS SMT AG (Germany)

f PAUL DRUDE INSTITUT FÜR FESTKÖRPERELEKTRONIK (Germany)

g UNIVERSITY COLLEGE CORK (Ireland)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 78149234047 PISSN: 10980121 EISSN: 1550235X Source Type: Journal
DOI: 10.1103/PhysRevB.82.161201 Document Type: Article

Times cited : (36)

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