Full optical scatter analysis for novel photonic and infrared metamaterials

Society for Experimental Mechanics - SEM Annual Conference and Exposition on Experimental and Applied Mechanics 2010

Volumn 2, Issue , 2010, Pages 1156-1164

  Fitzgerald, Thomas M ^a   Marciniak, Michael A ^a  

^a Air Force Institute of Technology   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ARTIFICIAL STRUCTURES; COMPUTATIONAL CODES; ELECTROMAGNETIC PROPERTIES; MATERIAL PROPERTY; METAMATERIAL STRUCTURES; OPTICAL DIAGNOSTIC TECHNIQUES; OPTICAL INTERFACES; OPTICAL LIMITERS; OPTICAL SCATTER; OPTICAL WAVELENGTH; PLASMONIC; PLASMONIC DEVICES; PROJECT GOALS; SUB-WAVELENGTH; THERMAL MANAGEMENT SYSTEMS; TRUE TIME DELAY; UNCERTAINTY LIMITS;

ANTENNAS; DELAY CIRCUITS; ELECTRONIC EQUIPMENT; MAGNETIC PROPERTIES; MATERIALS PROPERTIES; MECHANICS; METAMATERIALS; OPTICAL DATA PROCESSING; PHOTONIC CRYSTALS; PHOTONIC DEVICES; PLASMONS; POLARIMETERS; POLAROGRAPHIC ANALYSIS;

OPTICAL PROPERTIES;

EID: 78049439350     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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