-
1
-
-
0017983141
-
Photopolarimetric measurement of the Mueller matrix by Fourier analysis of a single detected signal
-
R. M. A. Azzam, “Photopolarimetric measurement of the Mueller matrix by Fourier analysis of a single detected signal,” Opt. Lett. 2, 148-150 (1977).
-
(1977)
Opt. Lett.
, vol.2
, pp. 148-150
-
-
Azzam, R.M.A.1
-
2
-
-
0018035140
-
Mueller matrix ellipsometry with imperfect compensators
-
P. S. Hauge, “Mueller matrix ellipsometry with imperfect compensators,” J. Opt. Soc. Am. 68, 1519-1528 (1978).
-
(1978)
J. Opt. Soc. Am.
, vol.68
, pp. 1519-1528
-
-
Hauge, P.S.1
-
3
-
-
84975609171
-
Error analysis of a Mueller matrix polarimeter
-
D. H. Goldstein and R. A. Chipman, “Error analysis of a Mueller matrix polarimeter,” J. Opt. Soc. Am. A 7, 693-700 (1990).
-
(1990)
J. Opt. Soc. Am. A
, vol.7
, pp. 693-700
-
-
Goldstein, D.H.1
Chipman, R.A.2
-
4
-
-
0026962422
-
Mueller matrix algorithms
-
D. Goldstein and R. Chipman, eds., Proc. SPIE
-
D. B. Chenault, J. L. Pezzaniti, and R. A. Chipman, “Mueller matrix algorithms,” in Polarization Analysis and Measurement, D. Goldstein and R. Chipman, eds., Proc. SPIE 1746, 231-246 (1992).
-
(1992)
Polarization Analysis and Measurement
, vol.1746
, pp. 231-246
-
-
Chenault, D.B.1
Pezzaniti, J.L.2
Chipman, R.A.3
-
5
-
-
36849101400
-
An improved method for high reflectivity ellipsometry based on a new polarization modulation technique
-
S. N. Jasperson and S. E. Schatterly, “An improved method for high reflectivity ellipsometry based on a new polarization modulation technique,” Rev. Sci. Instrum. 40, 761-767 (1969).
-
(1969)
Rev. Sci. Instrum.
, vol.40
, pp. 761-767
-
-
Jasperson, S.N.1
Schatterly, S.E.2
-
6
-
-
0346594843
-
Two-modulator generalized ellipsometer: Experiment and calibration
-
G. E. Jellison and F. A. Modine, “Two-modulator generalized ellipsometer: experiment and calibration,” Appl. Opt. 36, 8184-8189 (1997).
-
(1997)
Appl. Opt.
, vol.36
, pp. 8184-8189
-
-
Jellison, G.E.1
Modine, F.A.2
-
7
-
-
0019004115
-
Measurement of polarized light interactions via the Mueller matrix
-
R. C. Thompson, J. R. Bottinger, and E. S. Fry, “Measurement of polarized light interactions via the Mueller matrix,” Appl. Opt. 19, 1323-1332 (1980).
-
(1980)
Appl. Opt.
, vol.19
, pp. 1323-1332
-
-
Thompson, R.C.1
Bottinger, J.R.2
Fry, E.S.3
-
8
-
-
0028477428
-
Mueller-matrix ellipsometry using the division-of-amplitude photopolarimeter: A study of depolarization effects
-
S. Krishnan and P. C. Nordine, “Mueller-matrix ellipsometry using the division-of-amplitude photopolarimeter: a study of depolarization effects,” Appl. Opt. 33, 4184-4192 (1994).
-
(1994)
Appl. Opt.
, vol.33
, pp. 4184-4192
-
-
Krishnan, S.1
Nordine, P.C.2
-
9
-
-
84975641269
-
Mueller-matrix measurement using the four-detector photopolarimeter
-
R. M. A. Azzam, “Mueller-matrix measurement using the four-detector photopolarimeter,” Opt. Lett. 11, 270-272 (1986).
-
(1986)
Opt. Lett.
, vol.11
, pp. 270-272
-
-
Azzam, R.M.A.1
-
10
-
-
0001517329
-
Automated high-speed Mueller matrix scat-terometer
-
F. Delplancke, “Automated high-speed Mueller matrix scat-terometer,” Appl. Opt. 36, 5388-5395 (1997).
-
(1997)
Appl. Opt.
, vol.36
, pp. 5388-5395
-
-
Delplancke, F.1
-
11
-
-
0000973619
-
Polarimetry
-
2nd ed., M. Bass, ed. (McGraw-Hill, New York, Chap. 2
-
R. A. Chipman, “Polarimetry,” in Handbook of Optics, 2nd ed., M. Bass, ed. (McGraw-Hill, New York, 1995), Vol. 2, Chap. 2.
-
(1995)
Handbook of Optics
, vol.2
-
-
Chipman, R.A.1
-
13
-
-
0001350850
-
Optimization of retardance for a complete Stokes polarimeter
-
D. S. Sabatke, M. R. Descour, E. L. Dereniak, W. C. Sweatt, S. A. Kemme, and G. S. Phipps, “Optimization of retardance for a complete Stokes polarimeter,” Opt. Lett. 25, 802-804 (2000).
-
(2000)
Opt. Lett.
, vol.25
, pp. 802-804
-
-
Sabatke, D.S.1
Descour, M.R.2
Dereniak, E.L.3
Sweatt, W.C.4
Kemme, S.A.5
Phipps, G.S.6
-
14
-
-
0001303839
-
Noise equalization in Stokes parameter images obtained by use of variable-retardance polarimeters
-
J. S. Tyo, “Noise equalization in Stokes parameter images obtained by use of variable-retardance polarimeters,” Opt. Lett. 25, 1198-1200 (2000).
-
(2000)
Opt. Lett.
, vol.25
, pp. 1198-1200
-
-
Tyo, J.S.1
-
15
-
-
0028738246
-
Optimum angles for a Mueller matrix polarimeter
-
D. Goldstein and D. Chenault, eds., Proc. SPIE
-
A. Ambirajan and D. C. Look, “Optimum angles for a Mueller matrix polarimeter,” in Polarization Analysis and Measurement II, D. Goldstein and D. Chenault, eds., Proc. SPIE 2265, 314-326 (1994).
-
(1994)
Polarization Analysis and Measurement II
, vol.2265
, pp. 314-326
-
-
Ambirajan, A.1
Look, D.C.2
-
16
-
-
0035159142
-
Characterizing polarization controllers with Mueller matrix polarimetry
-
A. Dutta, A. Awwal, N. K. Dutta, and K. Okamoto, eds., Proc. SPIE
-
J. E. Drewes, R. A. Chipman, and M. H. Smith, “Characterizing polarization controllers with Mueller matrix polarimetry,” in Active and Passive Optical Components for WDM Communication, A. Dutta, A. Awwal, N. K. Dutta, and K. Okamoto, eds., Proc. SPIE 4532, 462-466 (2001).
-
(2001)
Active and Passive Optical Components for WDM Communication
, vol.4532
, pp. 462-466
-
-
Drewes, J.E.1
Chipman, R.A.2
Smith, M.H.3
-
17
-
-
5244244644
-
Interpretation of Mueller matrices based on polar decomposition
-
S. Lu and R. A. Chipman, “Interpretation of Mueller matrices based on polar decomposition,” J. Opt. Soc. A. 13, 1106-1113 (1996).
-
(1996)
J. Opt. Soc. A.
, vol.13
, pp. 1106-1113
-
-
Lu, S.1
Chipman, R.A.2
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