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Volumn 49, Issue 8 PART 4, 2010, Pages
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Scanning tunneling microscopy study of in situ hydrogenation of Si(110) surface
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Author keywords
[No Author keywords available]
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Indexed keywords
ATOMIC HYDROGEN;
CHEMICAL METHOD;
HIGHER TEMPERATURES;
IN-SITU HYDROGENATION;
SATURATION COVERAGE;
SI(110);
HYDROGENATION;
SCANNING TUNNELING MICROSCOPY;
SILICON;
SURFACE STRUCTURE;
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EID: 78049340715
PISSN: 00214922
EISSN: 13474065
Source Type: Journal
DOI: 10.1143/JJAP.49.08LB05 Document Type: Conference Paper |
Times cited : (2)
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References (22)
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