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Applied Physics A: Materials Science and Processing

Volumn 101, Issue 1, 2010, Pages 41-46

Nanoscale ablation through optically trapped microspheres

(4) Fardel, Romain a McLeod, Euan a,b Tsai, Yu Cheng a Arnold, Craig B a

a Princeton University (United States)

b California Institute of Technology (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CLOSE PROXIMITY; CRITICAL THRESHOLD; DENSITY FEATURES; DIRECT WRITE; FLUENCES; HIGH RESOLUTION; INITIAL POSITION; MICROBEADS; NANO SCALE; NANOPATTERNING; NEAR-FIELD; OPTICAL TRAP; SELF-POSITIONING; SIZE SCALE;

ABLATION;

EID: 78049334736 PISSN: 09478396 EISSN: 14320630 Source Type: Journal
DOI: 10.1007/s00339-010-5792-z Document Type: Article

Times cited : (19)

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