Which fractal parameter contributes most to adhesion?

Journal of Adhesion Science and Technology

Volumn 24, Issue 15-16, 2010, Pages 2383-2396

  Liu, D L ^a   Martin, J ^b   Burnham, N A ^a  

^a Life Science and Bioengineering Center   (United States)

^b ANALOG DEVICES INC   (United States)

Author keywords

Adhesion; AFM; MEMS; roughness

Indexed keywords

ADHESION MEASUREMENT; AFM; ATOMIC FORCE MICROSCOPES; CORRELATION LENGTHS; EXPERIMENTAL DATA; FRACTAL PARAMETERS; LATERAL CORRELATION LENGTH; LOW ADHESION; NANO SCALE; NANOSCALE DEVICE; ORDER OF MAGNITUDE; POLY-CRYSTALLINE SILICON; ROOT MEAN SQUARE ROUGHNESS; ROUGHNESS; ROUGHNESS CHANGE; ROUGHNESS EXPONENT; SAMPLE SURFACE; THEORETICAL BASIS;

ADHESION; ATOMIC FORCE MICROSCOPY; FRACTALS; NANOSTRUCTURED MATERIALS; POLYSILICON; SOIL STRUCTURE INTERACTIONS;

SURFACE ROUGHNESS;

EID: 77958611792     PISSN: 01694243     EISSN: 15685616     Source Type: Journal    
DOI: 10.1163/016942410X508280     Document Type: Article

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