Nanoadhesion between rough surfaces

Physical Review Letters

Volumn 86, Issue 20, 2001, Pages 4592-4595

  Chow, T S ^a  

^a XEROX CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ADHESION; FORMABILITY; INTERFACIAL ENERGY; MICROSTRUCTURE; SURFACE ROUGHNESS;

NANOADHESION;

SURFACE PROPERTIES;

EID: 0035858083     PISSN: 00319007     EISSN: None     Source Type: Journal    
DOI: 10.1103/PhysRevLett.86.4592     Document Type: Article

References (18)

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