Towards strain gauges based on a self-assembled nanoparticle monolayer - SAXS study

Nanotechnology

Volumn 21, Issue 38, 2010, Pages

  Siffalovic, P ^a   Chitu, L ^a   Vegso, K ^a   Majkova, E ^a   Jergel, M ^a   Weis, M ^a   Luby, S ^a   Capek, I ^b   Keckes, J ^c   Maier, G A ^d   Satka, A ^e   Perlich, J ^f   Roth, S V ^f  

^a INSTITUTE OF PHYSICS   (Slovakia)

^b POLYMER INSTITUTE   (Slovakia)

^c Erich Schmid Institute of Materials Science   (Austria)

^d MATERIALS CENTER LEOBEN FORSCHUNG GMBH   (Austria)

^e INTERNATIONAL LASER CENTER   (Slovakia)

^f DESY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

APPLIED FORCES; APPLIED STRESS; IN-SITU; MAXIMUM VALUES; MEMBRANE STRAIN; SELF ASSEMBLED NANOPARTICLES; SMALL ANGLE X-RAY SCATTERING; STRAIN GAUGE;

GAGES; SELF ASSEMBLED MONOLAYERS; X RAY SCATTERING;

NANOPARTICLES;

EID: 77958587675     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/21/38/385702     Document Type: Article

References (19)

1. Window A L and Holister G S (ed) 1992 Strain Gauge Technology (London: Elsevier Applied Science)
2. Herrmann J, Müller K H, Reda T, Baxter G R, Raguse B, de Groot G J J B, Chai R, Roberts M and Wieczorek L 2007 Appl. Phys. Lett. 91 183105
3. Vossmeyer T, Stolte C, Ijeh M, Kornowski A and Weller H 2008 Adv. Funct. Mater. 18 1611
4. Kabeer J, Thompson A and Berry V 2008 Small 4 2181
5. Grisolia J, Viallet B, Amiens C, Baster S, Cordan A S, Leroy Y, Soldano C, Brugger J and Ressier L 2009 Nanotechnology 20 355303
6. Bautistaa J R, Avilésa F, Olivab A I, Cehb O and Coronab J E 2010 Mater. Character. 61 325
7. Mueggenburg K E, Lin X-M, Goldsmith R H and Jaeger H M 2007 Nat. Mater. 6 656
8. Siffalovic P, Majkova E, Chitu L, Jergel M, Luby S, Satka A and Roth S V 2007 Phys. Rev. B 76 195432
9. Roth S V, Autenrieth T, Grubel G, Riekel C, Burghammer M, Hengstler R, Schulz L and Mueller-Buschbaum P 2007 Appl. Phys. Lett. 91 091915
10. Siffalovic P et al 2010 Langmuir 26 5451
11. Zeng H, Black T C, Sanstrom R L, Rice P M, Murray C B and Sun S 2006 Phys. Rev. B 73 020402(R)
12. Sun S, Zeng H, Robinson D B, Raoux S, Rice P M, Wang S X and Li G 2004 J. Am. Chem. Soc. 126 273
13. Roth S V, Döhrmann R, Dommach M, Kuhlmann M, Kröger I, Gehrke R, Walter H, Schroer C, Lengeler B and Müller-Buschbaum P 2006 Rev. Sci. Instrum. 77 085106
14. Guinier A 1963 X-ray Diffraction (San Francisco, CA: Freeman)
15. Renaud G, Lazzari R and Leroy F 2009 Surf. Sci. Rep. 64 255
16. Siffalovic P, Majkova E, Chitu L, Jergel M, Luby S, Capek I, Satka A, Timmann A and Roth S V 2008 Small 4 2222
17. Böhm J, Gruber P, Spolenak R, Stierle A, Wanner A and Arzt E 2004 Rev. Sci. Instrum. 75 1110
18. Olliges S, Grubern P A, Orso S, Auzelyte V, Ekinci Y, Solak H H and Spolenak R 2008 Scr. Mater. 58 175
19. Olliges S, Gruber P A, Auzelyte V, Ekinci Y, Solak H H and Spolenak R 2007 Acta Mater. 55 5201