Strong flux pinning due to dislocations associated with stacking faults in YBa2Cu3O7-Dδ thin films prepared by fluorine-free metal organic deposition

Superconductor Science and Technology

Volumn 23, Issue 10, 2010, Pages

  Yamasaki, H ^a   Ohki, K ^b   Yamaguchi, I ^a   Sohma, M ^a   Kondo, W ^a   Matsui, H ^a   Manabe, T ^a   Kumagai, T ^a  

^a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

^b SUMITOMO ELECTRIC INDUSTRIES LTD   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CROSS-SECTIONAL TEM; CURRENT DIRECTION; FLUORINE-FREE; HIGH DENSITY; MATRIX; METAL ORGANIC DEPOSITION; MOD-YBCO; PINNING CENTER; PLANAR PINNING CENTERS; SCALING ANALYSIS; TEM; THERMAL CO-EVAPORATION;

DEPOSITION; FILM PREPARATION; FLUORINE; FLUX PINNING; ORGANOMETALLICS; POINT DEFECTS; THERMAL EVAPORATION; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY; YTTRIUM BARIUM COPPER OXIDES;

STACKING FAULTS;

EID: 77958495552     PISSN: 09532048     EISSN: 13616668     Source Type: Journal    
DOI: 10.1088/0953-2048/23/10/105004     Document Type: Article

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